Electron ptychographic microscopy for three-dimensional imaging

Knowing the three-dimensional structural information of materials at the nanometer scale is essential to understanding complex material properties. Electron tomography retrieves three-dimensional structural information using a tilt series of two-dimensional images. In this paper, we report an altern...

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Detalles Bibliográficos
Autores principales: Gao, Si, Wang, Peng, Zhang, Fucai, Martinez, Gerardo T., Nellist, Peter D., Pan, Xiaoqing, Kirkland, Angus I.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5537274/
https://www.ncbi.nlm.nih.gov/pubmed/28761117
http://dx.doi.org/10.1038/s41467-017-00150-1
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author Gao, Si
Wang, Peng
Zhang, Fucai
Martinez, Gerardo T.
Nellist, Peter D.
Pan, Xiaoqing
Kirkland, Angus I.
author_facet Gao, Si
Wang, Peng
Zhang, Fucai
Martinez, Gerardo T.
Nellist, Peter D.
Pan, Xiaoqing
Kirkland, Angus I.
author_sort Gao, Si
collection PubMed
description Knowing the three-dimensional structural information of materials at the nanometer scale is essential to understanding complex material properties. Electron tomography retrieves three-dimensional structural information using a tilt series of two-dimensional images. In this paper, we report an alternative combination of electron ptychography with the inverse multislice method. We demonstrate depth sectioning of a nanostructured material into slices with 0.34 nm lateral resolution and with a corresponding depth resolution of about 24–30 nm. This three-dimensional imaging method has potential applications for the three-dimensional structure determination of a range of objects, ranging from inorganic nanostructures to biological macromolecules.
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spelling pubmed-55372742017-08-07 Electron ptychographic microscopy for three-dimensional imaging Gao, Si Wang, Peng Zhang, Fucai Martinez, Gerardo T. Nellist, Peter D. Pan, Xiaoqing Kirkland, Angus I. Nat Commun Article Knowing the three-dimensional structural information of materials at the nanometer scale is essential to understanding complex material properties. Electron tomography retrieves three-dimensional structural information using a tilt series of two-dimensional images. In this paper, we report an alternative combination of electron ptychography with the inverse multislice method. We demonstrate depth sectioning of a nanostructured material into slices with 0.34 nm lateral resolution and with a corresponding depth resolution of about 24–30 nm. This three-dimensional imaging method has potential applications for the three-dimensional structure determination of a range of objects, ranging from inorganic nanostructures to biological macromolecules. Nature Publishing Group UK 2017-07-31 /pmc/articles/PMC5537274/ /pubmed/28761117 http://dx.doi.org/10.1038/s41467-017-00150-1 Text en © The Author(s) 2017 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Gao, Si
Wang, Peng
Zhang, Fucai
Martinez, Gerardo T.
Nellist, Peter D.
Pan, Xiaoqing
Kirkland, Angus I.
Electron ptychographic microscopy for three-dimensional imaging
title Electron ptychographic microscopy for three-dimensional imaging
title_full Electron ptychographic microscopy for three-dimensional imaging
title_fullStr Electron ptychographic microscopy for three-dimensional imaging
title_full_unstemmed Electron ptychographic microscopy for three-dimensional imaging
title_short Electron ptychographic microscopy for three-dimensional imaging
title_sort electron ptychographic microscopy for three-dimensional imaging
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5537274/
https://www.ncbi.nlm.nih.gov/pubmed/28761117
http://dx.doi.org/10.1038/s41467-017-00150-1
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