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Graphene Enhanced Secondary Ion Mass Spectrometry (GESIMS)

The following invention - Graphene Enhanced Secondary Ion Mass Spectrometry - (pending European patent application no. EP 16461554.4) is related to a method of analysing a solid substrate by means of Secondary Ion Mass Spectrometry (SIMS). It comprises the steps of providing a graphene layer over th...

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Detalles Bibliográficos
Autores principales:	Michałowski, Paweł Piotr, Kaszub, Wawrzyniec, Pasternak, Iwona, Strupiński, Włodek
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Nature Publishing Group UK 2017
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5547038/ https://www.ncbi.nlm.nih.gov/pubmed/28785102 http://dx.doi.org/10.1038/s41598-017-07984-1

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