Toward Single Atom Chains with Exfoliated Tellurium

We demonstrate that the atom chain structure of Te allows it to be exfoliated as ultra-thin flakes and nanowires. Atomic force microscopy of exfoliated Te shows that thicknesses of 1–2 nm and widths below 100 nm can be exfoliated with this method. The Raman modes of exfoliated Te match those of bulk...

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Detalles Bibliográficos
Autores principales: Churchill, Hugh O. H., Salamo, Gregory J., Yu, Shui-Qing, Hironaka, Takayuki, Hu, Xian, Stacy, Jeb, Shih, Ishiang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2017
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5552621/
https://www.ncbi.nlm.nih.gov/pubmed/28799071
http://dx.doi.org/10.1186/s11671-017-2255-x
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author Churchill, Hugh O. H.
Salamo, Gregory J.
Yu, Shui-Qing
Hironaka, Takayuki
Hu, Xian
Stacy, Jeb
Shih, Ishiang
author_facet Churchill, Hugh O. H.
Salamo, Gregory J.
Yu, Shui-Qing
Hironaka, Takayuki
Hu, Xian
Stacy, Jeb
Shih, Ishiang
author_sort Churchill, Hugh O. H.
collection PubMed
description We demonstrate that the atom chain structure of Te allows it to be exfoliated as ultra-thin flakes and nanowires. Atomic force microscopy of exfoliated Te shows that thicknesses of 1–2 nm and widths below 100 nm can be exfoliated with this method. The Raman modes of exfoliated Te match those of bulk Te, with a slight shift (4 cm(−1)) due to a hardening of the A(1) and E modes. Polarized Raman spectroscopy is used to determine the crystal orientation of exfoliated Te flakes. These experiments establish exfoliation as a route to achieve nanoscale trigonal Te while also demonstrating the potential for fabrication of single atom chains of Te.
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spelling pubmed-55526212017-08-25 Toward Single Atom Chains with Exfoliated Tellurium Churchill, Hugh O. H. Salamo, Gregory J. Yu, Shui-Qing Hironaka, Takayuki Hu, Xian Stacy, Jeb Shih, Ishiang Nanoscale Res Lett Nano Express We demonstrate that the atom chain structure of Te allows it to be exfoliated as ultra-thin flakes and nanowires. Atomic force microscopy of exfoliated Te shows that thicknesses of 1–2 nm and widths below 100 nm can be exfoliated with this method. The Raman modes of exfoliated Te match those of bulk Te, with a slight shift (4 cm(−1)) due to a hardening of the A(1) and E modes. Polarized Raman spectroscopy is used to determine the crystal orientation of exfoliated Te flakes. These experiments establish exfoliation as a route to achieve nanoscale trigonal Te while also demonstrating the potential for fabrication of single atom chains of Te. Springer US 2017-08-10 /pmc/articles/PMC5552621/ /pubmed/28799071 http://dx.doi.org/10.1186/s11671-017-2255-x Text en © The Author(s). 2017 Open AccessThis article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.
spellingShingle Nano Express
Churchill, Hugh O. H.
Salamo, Gregory J.
Yu, Shui-Qing
Hironaka, Takayuki
Hu, Xian
Stacy, Jeb
Shih, Ishiang
Toward Single Atom Chains with Exfoliated Tellurium
title Toward Single Atom Chains with Exfoliated Tellurium
title_full Toward Single Atom Chains with Exfoliated Tellurium
title_fullStr Toward Single Atom Chains with Exfoliated Tellurium
title_full_unstemmed Toward Single Atom Chains with Exfoliated Tellurium
title_short Toward Single Atom Chains with Exfoliated Tellurium
title_sort toward single atom chains with exfoliated tellurium
topic Nano Express
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5552621/
https://www.ncbi.nlm.nih.gov/pubmed/28799071
http://dx.doi.org/10.1186/s11671-017-2255-x
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AT stacyjeb towardsingleatomchainswithexfoliatedtellurium
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