Cargando…
Toward Single Atom Chains with Exfoliated Tellurium
We demonstrate that the atom chain structure of Te allows it to be exfoliated as ultra-thin flakes and nanowires. Atomic force microscopy of exfoliated Te shows that thicknesses of 1–2 nm and widths below 100 nm can be exfoliated with this method. The Raman modes of exfoliated Te match those of bulk...
Autores principales: | Churchill, Hugh O. H., Salamo, Gregory J., Yu, Shui-Qing, Hironaka, Takayuki, Hu, Xian, Stacy, Jeb, Shih, Ishiang |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer US
2017
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5552621/ https://www.ncbi.nlm.nih.gov/pubmed/28799071 http://dx.doi.org/10.1186/s11671-017-2255-x |
Ejemplares similares
-
Structural and Photoconductivity Properties of Tellurium/PMMA Films
por: Carotenuto, Gianfranco, et al.
Publicado: (2015) -
The Growth of Polarization Domains in Ultrathin Ferroelectric Films Seeded by the Tip of an Atomic Force Microscope
por: Zamani-Alavijeh, Mohammad, et al.
Publicado: (2022) -
Photoconductivity Relaxation Mechanisms of InGaAs/GaAs Quantum Dot Chain Structures
por: Kondratenko, Serhiy V., et al.
Publicado: (2017) -
Millstone Exfoliation: a True Shear Exfoliation for Large-Size Few-Layer Graphene Oxide
por: Yoon, Heng-Ju, et al.
Publicado: (2018) -
Toward Exploring the Structure of Monolayer to Few-layer TaS(2) by Efficient Ultrasound-free Exfoliation
por: Hu, Yiwei, et al.
Publicado: (2018)