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Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

One of the challenges in microstructure analysis nowadays resides in the reliable and accurate characterization of ultra-fine grained (UFG) and nanocrystalline materials. The traditional techniques associated with scanning electron microscopy (SEM), such as electron backscatter diffraction (EBSD), d...

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Detalles Bibliográficos
Autores principales:	Proust, Gwénaëlle, Trimby, Patrick, Piazolo, Sandra, Retraint, Delphine
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MyJove Corporation 2017
Materias:	Engineering
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5564465/ https://www.ncbi.nlm.nih.gov/pubmed/28447998 http://dx.doi.org/10.3791/55506

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