Active control of bright electron beams with RF optics for femtosecond microscopy

A frontier challenge in implementing femtosecond electron microscopy is to gain precise optical control of intense beams to mitigate collective space charge effects for significantly improving the throughput. Here, we explore the flexible uses of an RF cavity as a longitudinal lens in a high-intensi...

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Detalles Bibliográficos
Autores principales: Williams, J., Zhou, F., Sun, T., Tao, Z., Chang, K., Makino, K., Berz, M., Duxbury, P. M., Ruan, C.-Y.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Crystallographic Association 2017
Materias:
Ultrafast Structural Dynamics—A Tribute to Ahmed H. Zewail
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5565489/
https://www.ncbi.nlm.nih.gov/pubmed/28868325
http://dx.doi.org/10.1063/1.4999456

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5565489/
https://www.ncbi.nlm.nih.gov/pubmed/28868325
http://dx.doi.org/10.1063/1.4999456

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