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High-resolution X-ray diffraction with no sample preparation

It is shown that energy-dispersive X-ray diffraction (EDXRD) implemented in a back-reflection geometry is extremely insensitive to sample morphology and positioning even in a high-resolution configuration. This technique allows high-quality X-ray diffraction analysis of samples that have not been pr...

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Detalles Bibliográficos
Autores principales: Hansford, G. M., Turner, S. M. R., Degryse, P., Shortland, A. J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5571747/
https://www.ncbi.nlm.nih.gov/pubmed/28660862
http://dx.doi.org/10.1107/S2053273317008592