A Multiscale Material Testing System for In Situ Optical and Electron Microscopes and Its Application

We report a novel material testing system (MTS) that uses hierarchical designs for in-situ mechanical characterization of multiscale materials. This MTS is adaptable for use in optical microscopes (OMs) and scanning electron microscopes (SEMs). The system consists of a microscale material testing mo...

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Detalles Bibliográficos
Autores principales: Ye, Xuan, Cui, Zhiguo, Fang, Huajun, Li, Xide
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5579585/
https://www.ncbi.nlm.nih.gov/pubmed/28777341
http://dx.doi.org/10.3390/s17081800

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5579585/
https://www.ncbi.nlm.nih.gov/pubmed/28777341
http://dx.doi.org/10.3390/s17081800

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