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A Multiscale Material Testing System for In Situ Optical and Electron Microscopes and Its Application
We report a novel material testing system (MTS) that uses hierarchical designs for in-situ mechanical characterization of multiscale materials. This MTS is adaptable for use in optical microscopes (OMs) and scanning electron microscopes (SEMs). The system consists of a microscale material testing mo...
Autores principales: | Ye, Xuan, Cui, Zhiguo, Fang, Huajun, Li, Xide |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5579585/ https://www.ncbi.nlm.nih.gov/pubmed/28777341 http://dx.doi.org/10.3390/s17081800 |
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