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Quantitative trait loci responsible for sharp eyespot resistance in common wheat CI12633
Sharp eyespot is a major fungal disease of wheat caused by Rhizoctonia cerealis in cool and humid environments worldwide. In this study, 224 single seed descent derived F(13), F(14) and F(15) recombinant inbred lines (RILs) from the cross between CI12633 (a resistant cultivar) and Yangmai 9 (a susce...
Autores principales: | , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5603610/ https://www.ncbi.nlm.nih.gov/pubmed/28924253 http://dx.doi.org/10.1038/s41598-017-12197-7 |
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author | Wu, Xujiang Cheng, Kai Zhao, Renhui Zang, Shujiang Bie, Tongde Jiang, Zhengning Wu, Ronglin Gao, Derong Zhang, Boqiao |
author_facet | Wu, Xujiang Cheng, Kai Zhao, Renhui Zang, Shujiang Bie, Tongde Jiang, Zhengning Wu, Ronglin Gao, Derong Zhang, Boqiao |
author_sort | Wu, Xujiang |
collection | PubMed |
description | Sharp eyespot is a major fungal disease of wheat caused by Rhizoctonia cerealis in cool and humid environments worldwide. In this study, 224 single seed descent derived F(13), F(14) and F(15) recombinant inbred lines (RILs) from the cross between CI12633 (a resistant cultivar) and Yangmai 9 (a susceptible cultivar) were assessed for sharp eyespot resistance (R.cerealis isolate R0301) in field and greenhouse conditions in three growing seasons. Different agronomic characteristics were also evaluated in the field with no disease infection. All the lines were genotyped with the Illumina iSelect 90 K SNP wheat chip and 101 SSR markers. Sharp eyespot resistance was significantly negatively correlated with heading date and tiller angle, and significantly positively correlated with the diameter of the basal first internode and second internode. Five QTL with a likelihood of odds ratio score of higher than 3.0 were detected on chromosomes 2BS, 4BS, 5AL and 5BS, respectively. These identified QTL may be used in future wheat breeding programs through marker assisted selection for developing sharp eyespot resistant cultivars. |
format | Online Article Text |
id | pubmed-5603610 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2017 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-56036102017-09-20 Quantitative trait loci responsible for sharp eyespot resistance in common wheat CI12633 Wu, Xujiang Cheng, Kai Zhao, Renhui Zang, Shujiang Bie, Tongde Jiang, Zhengning Wu, Ronglin Gao, Derong Zhang, Boqiao Sci Rep Article Sharp eyespot is a major fungal disease of wheat caused by Rhizoctonia cerealis in cool and humid environments worldwide. In this study, 224 single seed descent derived F(13), F(14) and F(15) recombinant inbred lines (RILs) from the cross between CI12633 (a resistant cultivar) and Yangmai 9 (a susceptible cultivar) were assessed for sharp eyespot resistance (R.cerealis isolate R0301) in field and greenhouse conditions in three growing seasons. Different agronomic characteristics were also evaluated in the field with no disease infection. All the lines were genotyped with the Illumina iSelect 90 K SNP wheat chip and 101 SSR markers. Sharp eyespot resistance was significantly negatively correlated with heading date and tiller angle, and significantly positively correlated with the diameter of the basal first internode and second internode. Five QTL with a likelihood of odds ratio score of higher than 3.0 were detected on chromosomes 2BS, 4BS, 5AL and 5BS, respectively. These identified QTL may be used in future wheat breeding programs through marker assisted selection for developing sharp eyespot resistant cultivars. Nature Publishing Group UK 2017-09-18 /pmc/articles/PMC5603610/ /pubmed/28924253 http://dx.doi.org/10.1038/s41598-017-12197-7 Text en © The Author(s) 2017 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Wu, Xujiang Cheng, Kai Zhao, Renhui Zang, Shujiang Bie, Tongde Jiang, Zhengning Wu, Ronglin Gao, Derong Zhang, Boqiao Quantitative trait loci responsible for sharp eyespot resistance in common wheat CI12633 |
title | Quantitative trait loci responsible for sharp eyespot resistance in common wheat CI12633 |
title_full | Quantitative trait loci responsible for sharp eyespot resistance in common wheat CI12633 |
title_fullStr | Quantitative trait loci responsible for sharp eyespot resistance in common wheat CI12633 |
title_full_unstemmed | Quantitative trait loci responsible for sharp eyespot resistance in common wheat CI12633 |
title_short | Quantitative trait loci responsible for sharp eyespot resistance in common wheat CI12633 |
title_sort | quantitative trait loci responsible for sharp eyespot resistance in common wheat ci12633 |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5603610/ https://www.ncbi.nlm.nih.gov/pubmed/28924253 http://dx.doi.org/10.1038/s41598-017-12197-7 |
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