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Optical dating in a new light: A direct, non-destructive probe of trapped electrons
Optical dating has revolutionized our understanding of Global climate change, Earth surface processes, and human evolution and dispersal over the last ~500 ka. Optical dating is based on an anti-Stokes photon emission generated by electron-hole recombination within quartz or feldspar; it relies, by...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5615069/ https://www.ncbi.nlm.nih.gov/pubmed/28951569 http://dx.doi.org/10.1038/s41598-017-10174-8 |
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author | Prasad, Amit Kumar Poolton, Nigel R. J. Kook, Myungho Jain, Mayank |
author_facet | Prasad, Amit Kumar Poolton, Nigel R. J. Kook, Myungho Jain, Mayank |
author_sort | Prasad, Amit Kumar |
collection | PubMed |
description | Optical dating has revolutionized our understanding of Global climate change, Earth surface processes, and human evolution and dispersal over the last ~500 ka. Optical dating is based on an anti-Stokes photon emission generated by electron-hole recombination within quartz or feldspar; it relies, by default, on destructive read-out of the stored chronometric information. We present here a fundamentally new method of optical read-out of the trapped electron population in feldspar. The new signal termed as Infra-Red Photo-Luminescence (IRPL) is a Stokes emission (~1.30 eV) derived from NIR excitation (~1.40 eV) on samples previously exposed to ionizing radiation. Low temperature (7–295 K) spectroscopic and time-resolved investigations suggest that IRPL is generated from excited-to-ground state relaxation within the principal (dosimetry) trap. Since IRPL can be induced even in traps remote from recombination centers, it is likely to contain a stable (non-fading), steady-state component. While IRPL is a powerful tool to understand details of the electron-trapping center, it provides a novel, alternative approach to trapped-charge dating based on direct, non-destructive probing of chronometric information. The possibility of repeated readout of IRPL from individual traps will open opportunities for dating at sub-micron spatial resolution, thus, marking a step change in the optical dating technology. |
format | Online Article Text |
id | pubmed-5615069 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2017 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-56150692017-10-11 Optical dating in a new light: A direct, non-destructive probe of trapped electrons Prasad, Amit Kumar Poolton, Nigel R. J. Kook, Myungho Jain, Mayank Sci Rep Article Optical dating has revolutionized our understanding of Global climate change, Earth surface processes, and human evolution and dispersal over the last ~500 ka. Optical dating is based on an anti-Stokes photon emission generated by electron-hole recombination within quartz or feldspar; it relies, by default, on destructive read-out of the stored chronometric information. We present here a fundamentally new method of optical read-out of the trapped electron population in feldspar. The new signal termed as Infra-Red Photo-Luminescence (IRPL) is a Stokes emission (~1.30 eV) derived from NIR excitation (~1.40 eV) on samples previously exposed to ionizing radiation. Low temperature (7–295 K) spectroscopic and time-resolved investigations suggest that IRPL is generated from excited-to-ground state relaxation within the principal (dosimetry) trap. Since IRPL can be induced even in traps remote from recombination centers, it is likely to contain a stable (non-fading), steady-state component. While IRPL is a powerful tool to understand details of the electron-trapping center, it provides a novel, alternative approach to trapped-charge dating based on direct, non-destructive probing of chronometric information. The possibility of repeated readout of IRPL from individual traps will open opportunities for dating at sub-micron spatial resolution, thus, marking a step change in the optical dating technology. Nature Publishing Group UK 2017-09-26 /pmc/articles/PMC5615069/ /pubmed/28951569 http://dx.doi.org/10.1038/s41598-017-10174-8 Text en © The Author(s) 2017 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Prasad, Amit Kumar Poolton, Nigel R. J. Kook, Myungho Jain, Mayank Optical dating in a new light: A direct, non-destructive probe of trapped electrons |
title | Optical dating in a new light: A direct, non-destructive probe of trapped electrons |
title_full | Optical dating in a new light: A direct, non-destructive probe of trapped electrons |
title_fullStr | Optical dating in a new light: A direct, non-destructive probe of trapped electrons |
title_full_unstemmed | Optical dating in a new light: A direct, non-destructive probe of trapped electrons |
title_short | Optical dating in a new light: A direct, non-destructive probe of trapped electrons |
title_sort | optical dating in a new light: a direct, non-destructive probe of trapped electrons |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5615069/ https://www.ncbi.nlm.nih.gov/pubmed/28951569 http://dx.doi.org/10.1038/s41598-017-10174-8 |
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