Magnetoelectric Force Microscopy on Antiferromagnetic 180(∘) Domains in Cr(2)O(3)

Magnetoelectric force microscopy (MeFM) is characterized as methodical tool for the investigation of antiferromagnetic domain states, in particular of the 180 [Formula: see text] variety. As reference compound for this investigation we use Cr [Formula: see text] O [Formula: see text]. Access to the...

Descripción completa

Detalles Bibliográficos
Autores principales: Schoenherr, Peggy, Giraldo, L. Marcela, Lilienblum, Martin, Trassin, Morgan, Meier, Dennis, Fiebig, Manfred
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5615706/
https://www.ncbi.nlm.nih.gov/pubmed/28880233
http://dx.doi.org/10.3390/ma10091051
Descripción
Sumario:Magnetoelectric force microscopy (MeFM) is characterized as methodical tool for the investigation of antiferromagnetic domain states, in particular of the 180 [Formula: see text] variety. As reference compound for this investigation we use Cr [Formula: see text] O [Formula: see text]. Access to the antiferromagnetic order is provided by the linear magnetoelectric effect. We resolve the opposite antiferromagnetic 180 [Formula: see text] domain states of Cr [Formula: see text] O [Formula: see text] and estimate the sensitivity of the MeFM approach, its inherent advantages in comparison to alternative techniques and its general feasibility for probing antiferromagnetic order.

Ejemplares similares