Growth and characterization of textured well-faceted ZnO on planar Si(100), planar Si(111), and textured Si(100) substrates for solar cell applications

In this work, textured, well-faceted ZnO materials grown on planar Si(100), planar Si(111), and textured Si(100) substrates by low-pressure chemical vapor deposition (LPCVD) were analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and cathode lumin...

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Detalles Bibliográficos
Autores principales: Tsai, Chin-Yi, Lai, Jyong-Di, Feng, Shih-Wei, Huang, Chien-Jung, Chen, Chien-Hsun, Yang, Fann-Wei, Wang, Hsiang-Chen, Tu, Li-Wei
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2017
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5629404/
https://www.ncbi.nlm.nih.gov/pubmed/29046841
http://dx.doi.org/10.3762/bjnano.8.194

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5629404/
https://www.ncbi.nlm.nih.gov/pubmed/29046841
http://dx.doi.org/10.3762/bjnano.8.194

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