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A Cu-atom-chain current channel with a width of approximately 0.246 nm on (5, 0) single-wall carbon nanotube
Continuous miniaturization with improved performance has enabled the development of electronic devices. However, further shrinking of electronic circuits will push feature sizes (linewidths) firmly into the nanoscale. This can cause electronic devices built using current materials (silicon-based) an...
Autores principales: | Wang, Yue, Zhu, Kaigui, Shao, Qingyi |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5634995/ https://www.ncbi.nlm.nih.gov/pubmed/29018262 http://dx.doi.org/10.1038/s41598-017-13286-3 |
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