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Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers

The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by s...

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Detalles Bibliográficos
Autores principales: Wiedorn, Max O., Awel, Salah, Morgan, Andrew J., Barthelmess, Miriam, Bean, Richard, Beyerlein, Kenneth R., Chavas, Leonard M. G., Eckerskorn, Niko, Fleckenstein, Holger, Heymann, Michael, Horke, Daniel A., Knoška, Juraj, Mariani, Valerio, Oberthür, Dominik, Roth, Nils, Yefanov, Oleksandr, Barty, Anton, Bajt, Saša, Küpper, Jochen, Rode, Andrei V., Kirian, Richard A., Chapman, Henry N.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5665296/
https://www.ncbi.nlm.nih.gov/pubmed/29091073
http://dx.doi.org/10.1107/S1600577517011961
Descripción
Sumario:The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce background scattering by placing an aperture downstream of the sample has been developed and its application in a single-particle X-ray imaging experiment at FLASH is demonstrated. Using the concept of a post-sample aperture it was possible to reduce the background scattering levels by two orders of magnitude.