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Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers
The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by s...
Autores principales: | , , , , , , , , , , , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5665296/ https://www.ncbi.nlm.nih.gov/pubmed/29091073 http://dx.doi.org/10.1107/S1600577517011961 |
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author | Wiedorn, Max O. Awel, Salah Morgan, Andrew J. Barthelmess, Miriam Bean, Richard Beyerlein, Kenneth R. Chavas, Leonard M. G. Eckerskorn, Niko Fleckenstein, Holger Heymann, Michael Horke, Daniel A. Knoška, Juraj Mariani, Valerio Oberthür, Dominik Roth, Nils Yefanov, Oleksandr Barty, Anton Bajt, Saša Küpper, Jochen Rode, Andrei V. Kirian, Richard A. Chapman, Henry N. |
author_facet | Wiedorn, Max O. Awel, Salah Morgan, Andrew J. Barthelmess, Miriam Bean, Richard Beyerlein, Kenneth R. Chavas, Leonard M. G. Eckerskorn, Niko Fleckenstein, Holger Heymann, Michael Horke, Daniel A. Knoška, Juraj Mariani, Valerio Oberthür, Dominik Roth, Nils Yefanov, Oleksandr Barty, Anton Bajt, Saša Küpper, Jochen Rode, Andrei V. Kirian, Richard A. Chapman, Henry N. |
author_sort | Wiedorn, Max O. |
collection | PubMed |
description | The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce background scattering by placing an aperture downstream of the sample has been developed and its application in a single-particle X-ray imaging experiment at FLASH is demonstrated. Using the concept of a post-sample aperture it was possible to reduce the background scattering levels by two orders of magnitude. |
format | Online Article Text |
id | pubmed-5665296 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2017 |
publisher | International Union of Crystallography |
record_format | MEDLINE/PubMed |
spelling | pubmed-56652962017-11-09 Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers Wiedorn, Max O. Awel, Salah Morgan, Andrew J. Barthelmess, Miriam Bean, Richard Beyerlein, Kenneth R. Chavas, Leonard M. G. Eckerskorn, Niko Fleckenstein, Holger Heymann, Michael Horke, Daniel A. Knoška, Juraj Mariani, Valerio Oberthür, Dominik Roth, Nils Yefanov, Oleksandr Barty, Anton Bajt, Saša Küpper, Jochen Rode, Andrei V. Kirian, Richard A. Chapman, Henry N. J Synchrotron Radiat Laboratory Notes The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce background scattering by placing an aperture downstream of the sample has been developed and its application in a single-particle X-ray imaging experiment at FLASH is demonstrated. Using the concept of a post-sample aperture it was possible to reduce the background scattering levels by two orders of magnitude. International Union of Crystallography 2017-10-16 /pmc/articles/PMC5665296/ /pubmed/29091073 http://dx.doi.org/10.1107/S1600577517011961 Text en © Max O. Wiedorn et al. 2017 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.http://creativecommons.org/licenses/by/2.0/uk/ |
spellingShingle | Laboratory Notes Wiedorn, Max O. Awel, Salah Morgan, Andrew J. Barthelmess, Miriam Bean, Richard Beyerlein, Kenneth R. Chavas, Leonard M. G. Eckerskorn, Niko Fleckenstein, Holger Heymann, Michael Horke, Daniel A. Knoška, Juraj Mariani, Valerio Oberthür, Dominik Roth, Nils Yefanov, Oleksandr Barty, Anton Bajt, Saša Küpper, Jochen Rode, Andrei V. Kirian, Richard A. Chapman, Henry N. Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers |
title | Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers |
title_full | Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers |
title_fullStr | Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers |
title_full_unstemmed | Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers |
title_short | Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers |
title_sort | post-sample aperture for low background diffraction experiments at x-ray free-electron lasers |
topic | Laboratory Notes |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5665296/ https://www.ncbi.nlm.nih.gov/pubmed/29091073 http://dx.doi.org/10.1107/S1600577517011961 |
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