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Probing optical anisotropy of nanometer-thin van der waals microcrystals by near-field imaging

Most van der Waals crystals present highly anisotropic optical responses due to their strong in-plane covalent bonding and weak out-of-plane interactions. However, the determination of the polarization-dependent dielectric constants of van der Waals crystals remains a nontrivial task, since the size...

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Autores principales: Hu, Debo, Yang, Xiaoxia, Li, Chi, Liu, Ruina, Yao, Ziheng, Hu, Hai, Corder, Stephanie N. Gilbert, Chen, Jianing, Sun, Zhipei, Liu, Mengkun, Dai, Qing
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5684389/
https://www.ncbi.nlm.nih.gov/pubmed/29133779
http://dx.doi.org/10.1038/s41467-017-01580-7
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author Hu, Debo
Yang, Xiaoxia
Li, Chi
Liu, Ruina
Yao, Ziheng
Hu, Hai
Corder, Stephanie N. Gilbert
Chen, Jianing
Sun, Zhipei
Liu, Mengkun
Dai, Qing
author_facet Hu, Debo
Yang, Xiaoxia
Li, Chi
Liu, Ruina
Yao, Ziheng
Hu, Hai
Corder, Stephanie N. Gilbert
Chen, Jianing
Sun, Zhipei
Liu, Mengkun
Dai, Qing
author_sort Hu, Debo
collection PubMed
description Most van der Waals crystals present highly anisotropic optical responses due to their strong in-plane covalent bonding and weak out-of-plane interactions. However, the determination of the polarization-dependent dielectric constants of van der Waals crystals remains a nontrivial task, since the size and dimension of the samples are often below or close to the diffraction limit of the probe light. In this work, we apply an optical nano-imaging technique to determine the anisotropic dielectric constants in representative van der Waals crystals. Through the study of both ordinary and extraordinary waveguide modes in real space, we are able to quantitatively determine the full dielectric tensors of nanometer-thin molybdenum disulfide and hexagonal boron nitride microcrystals, the most-promising van der Waals semiconductor and dielectric. Unlike traditional reflection-based methods, our measurements are reliable below the length scale of the free-space wavelength and reveal a universal route for characterizing low-dimensional crystals with high anisotropies.
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spelling pubmed-56843892017-11-17 Probing optical anisotropy of nanometer-thin van der waals microcrystals by near-field imaging Hu, Debo Yang, Xiaoxia Li, Chi Liu, Ruina Yao, Ziheng Hu, Hai Corder, Stephanie N. Gilbert Chen, Jianing Sun, Zhipei Liu, Mengkun Dai, Qing Nat Commun Article Most van der Waals crystals present highly anisotropic optical responses due to their strong in-plane covalent bonding and weak out-of-plane interactions. However, the determination of the polarization-dependent dielectric constants of van der Waals crystals remains a nontrivial task, since the size and dimension of the samples are often below or close to the diffraction limit of the probe light. In this work, we apply an optical nano-imaging technique to determine the anisotropic dielectric constants in representative van der Waals crystals. Through the study of both ordinary and extraordinary waveguide modes in real space, we are able to quantitatively determine the full dielectric tensors of nanometer-thin molybdenum disulfide and hexagonal boron nitride microcrystals, the most-promising van der Waals semiconductor and dielectric. Unlike traditional reflection-based methods, our measurements are reliable below the length scale of the free-space wavelength and reveal a universal route for characterizing low-dimensional crystals with high anisotropies. Nature Publishing Group UK 2017-11-13 /pmc/articles/PMC5684389/ /pubmed/29133779 http://dx.doi.org/10.1038/s41467-017-01580-7 Text en © The Author(s) 2017 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Hu, Debo
Yang, Xiaoxia
Li, Chi
Liu, Ruina
Yao, Ziheng
Hu, Hai
Corder, Stephanie N. Gilbert
Chen, Jianing
Sun, Zhipei
Liu, Mengkun
Dai, Qing
Probing optical anisotropy of nanometer-thin van der waals microcrystals by near-field imaging
title Probing optical anisotropy of nanometer-thin van der waals microcrystals by near-field imaging
title_full Probing optical anisotropy of nanometer-thin van der waals microcrystals by near-field imaging
title_fullStr Probing optical anisotropy of nanometer-thin van der waals microcrystals by near-field imaging
title_full_unstemmed Probing optical anisotropy of nanometer-thin van der waals microcrystals by near-field imaging
title_short Probing optical anisotropy of nanometer-thin van der waals microcrystals by near-field imaging
title_sort probing optical anisotropy of nanometer-thin van der waals microcrystals by near-field imaging
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5684389/
https://www.ncbi.nlm.nih.gov/pubmed/29133779
http://dx.doi.org/10.1038/s41467-017-01580-7
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