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Control of the interaction strength of photonic molecules by nanometer precise 3D fabrication
Applications for high resolution 3D profiles, so-called grayscale lithography, exist in diverse fields such as optics, nanofluidics and tribology. All of them require the fabrication of patterns with reliable absolute patterning depth independent of the substrate location and target materials. Here...
Autores principales: | , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5705769/ https://www.ncbi.nlm.nih.gov/pubmed/29184150 http://dx.doi.org/10.1038/s41598-017-16496-x |
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author | Rawlings, Colin D. Zientek, Michal Spieser, Martin Urbonas, Darius Stöferle, Thilo Mahrt, Rainer F. Lisunova, Yuliya Brugger, Juergen Duerig, Urs Knoll, Armin W. |
author_facet | Rawlings, Colin D. Zientek, Michal Spieser, Martin Urbonas, Darius Stöferle, Thilo Mahrt, Rainer F. Lisunova, Yuliya Brugger, Juergen Duerig, Urs Knoll, Armin W. |
author_sort | Rawlings, Colin D. |
collection | PubMed |
description | Applications for high resolution 3D profiles, so-called grayscale lithography, exist in diverse fields such as optics, nanofluidics and tribology. All of them require the fabrication of patterns with reliable absolute patterning depth independent of the substrate location and target materials. Here we present a complete patterning and pattern-transfer solution based on thermal scanning probe lithography (t-SPL) and dry etching. We demonstrate the fabrication of 3D profiles in silicon and silicon oxide with nanometer scale accuracy of absolute depth levels. An accuracy of less than 1nm standard deviation in t-SPL is achieved by providing an accurate physical model of the writing process to a model-based implementation of a closed-loop lithography process. For transfering the pattern to a target substrate we optimized the etch process and demonstrate linear amplification of grayscale patterns into silicon and silicon oxide with amplification ratios of ∼6 and ∼1, respectively. The performance of the entire process is demonstrated by manufacturing photonic molecules of desired interaction strength. Excellent agreement of fabricated and simulated structures has been achieved. |
format | Online Article Text |
id | pubmed-5705769 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2017 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-57057692017-12-05 Control of the interaction strength of photonic molecules by nanometer precise 3D fabrication Rawlings, Colin D. Zientek, Michal Spieser, Martin Urbonas, Darius Stöferle, Thilo Mahrt, Rainer F. Lisunova, Yuliya Brugger, Juergen Duerig, Urs Knoll, Armin W. Sci Rep Article Applications for high resolution 3D profiles, so-called grayscale lithography, exist in diverse fields such as optics, nanofluidics and tribology. All of them require the fabrication of patterns with reliable absolute patterning depth independent of the substrate location and target materials. Here we present a complete patterning and pattern-transfer solution based on thermal scanning probe lithography (t-SPL) and dry etching. We demonstrate the fabrication of 3D profiles in silicon and silicon oxide with nanometer scale accuracy of absolute depth levels. An accuracy of less than 1nm standard deviation in t-SPL is achieved by providing an accurate physical model of the writing process to a model-based implementation of a closed-loop lithography process. For transfering the pattern to a target substrate we optimized the etch process and demonstrate linear amplification of grayscale patterns into silicon and silicon oxide with amplification ratios of ∼6 and ∼1, respectively. The performance of the entire process is demonstrated by manufacturing photonic molecules of desired interaction strength. Excellent agreement of fabricated and simulated structures has been achieved. Nature Publishing Group UK 2017-11-28 /pmc/articles/PMC5705769/ /pubmed/29184150 http://dx.doi.org/10.1038/s41598-017-16496-x Text en © The Author(s) 2017 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Rawlings, Colin D. Zientek, Michal Spieser, Martin Urbonas, Darius Stöferle, Thilo Mahrt, Rainer F. Lisunova, Yuliya Brugger, Juergen Duerig, Urs Knoll, Armin W. Control of the interaction strength of photonic molecules by nanometer precise 3D fabrication |
title | Control of the interaction strength of photonic molecules by nanometer precise 3D fabrication |
title_full | Control of the interaction strength of photonic molecules by nanometer precise 3D fabrication |
title_fullStr | Control of the interaction strength of photonic molecules by nanometer precise 3D fabrication |
title_full_unstemmed | Control of the interaction strength of photonic molecules by nanometer precise 3D fabrication |
title_short | Control of the interaction strength of photonic molecules by nanometer precise 3D fabrication |
title_sort | control of the interaction strength of photonic molecules by nanometer precise 3d fabrication |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5705769/ https://www.ncbi.nlm.nih.gov/pubmed/29184150 http://dx.doi.org/10.1038/s41598-017-16496-x |
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