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Reduced Graphene Oxide on Nickel Foam for Supercapacitor Electrodes

The focus of this paper is the investigation of reduced graphene oxide (GO)/nickel foam (RGON) samples for use as supercapacitor electrodes. Nickel foam samples were soaked in a GO suspension and dried before being subjected to two different methods to remove oxygen. Atmospheric pressure annealed (A...

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Autores principales: Ramabadran, Uma, Ryan, Gillian, Zhou, Xuan, Farhat, Susan, Manciu, Felicia, Tong, Yigang, Ayler, Ryan, Garner, Graham
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5706242/
https://www.ncbi.nlm.nih.gov/pubmed/29137133
http://dx.doi.org/10.3390/ma10111295
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author Ramabadran, Uma
Ryan, Gillian
Zhou, Xuan
Farhat, Susan
Manciu, Felicia
Tong, Yigang
Ayler, Ryan
Garner, Graham
author_facet Ramabadran, Uma
Ryan, Gillian
Zhou, Xuan
Farhat, Susan
Manciu, Felicia
Tong, Yigang
Ayler, Ryan
Garner, Graham
author_sort Ramabadran, Uma
collection PubMed
description The focus of this paper is the investigation of reduced graphene oxide (GO)/nickel foam (RGON) samples for use as supercapacitor electrodes. Nickel foam samples were soaked in a GO suspension and dried before being subjected to two different methods to remove oxygen. Atmospheric pressure annealed (APA) samples were treated with a varying number (10–18) of nitrogen plasma jet scans, where sample temperatures did not exceed 280 °C. Furnace annealed (FA) samples were processed in an atmosphere of hydrogen and argon, at temperatures ranging from 600 °C to 900 °C. Environmental Scanning Electron Microscope (ESEM) data indicated that the carbon to oxygen (C:O) ratio for APA samples was minimized at an intermediate number of plasma scans. Fourier Transform Infrared Spectroscopic (FTIR) and Raman spectroscopic data supported this finding. ESEM analysis from FA samples showed that with increasing temperatures of annealing, GO is transformed to reduced graphene oxide (RGO), with C:O ratios exceeding 35:1. X-ray Photoelectron Spectroscopy (XPS) and X-ray diffraction (XRD) data indicated the formation of RGO with an increasing annealing temperature until 800 °C, when oxygen reincorporation in the surface atomic layers becomes an issue. Supercapacitors, constructed using the FA samples, demonstrated performances that correlated with surface atomic layer optimization of the C:O ratio.
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spelling pubmed-57062422017-12-04 Reduced Graphene Oxide on Nickel Foam for Supercapacitor Electrodes Ramabadran, Uma Ryan, Gillian Zhou, Xuan Farhat, Susan Manciu, Felicia Tong, Yigang Ayler, Ryan Garner, Graham Materials (Basel) Article The focus of this paper is the investigation of reduced graphene oxide (GO)/nickel foam (RGON) samples for use as supercapacitor electrodes. Nickel foam samples were soaked in a GO suspension and dried before being subjected to two different methods to remove oxygen. Atmospheric pressure annealed (APA) samples were treated with a varying number (10–18) of nitrogen plasma jet scans, where sample temperatures did not exceed 280 °C. Furnace annealed (FA) samples were processed in an atmosphere of hydrogen and argon, at temperatures ranging from 600 °C to 900 °C. Environmental Scanning Electron Microscope (ESEM) data indicated that the carbon to oxygen (C:O) ratio for APA samples was minimized at an intermediate number of plasma scans. Fourier Transform Infrared Spectroscopic (FTIR) and Raman spectroscopic data supported this finding. ESEM analysis from FA samples showed that with increasing temperatures of annealing, GO is transformed to reduced graphene oxide (RGO), with C:O ratios exceeding 35:1. X-ray Photoelectron Spectroscopy (XPS) and X-ray diffraction (XRD) data indicated the formation of RGO with an increasing annealing temperature until 800 °C, when oxygen reincorporation in the surface atomic layers becomes an issue. Supercapacitors, constructed using the FA samples, demonstrated performances that correlated with surface atomic layer optimization of the C:O ratio. MDPI 2017-11-11 /pmc/articles/PMC5706242/ /pubmed/29137133 http://dx.doi.org/10.3390/ma10111295 Text en © 2017 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Ramabadran, Uma
Ryan, Gillian
Zhou, Xuan
Farhat, Susan
Manciu, Felicia
Tong, Yigang
Ayler, Ryan
Garner, Graham
Reduced Graphene Oxide on Nickel Foam for Supercapacitor Electrodes
title Reduced Graphene Oxide on Nickel Foam for Supercapacitor Electrodes
title_full Reduced Graphene Oxide on Nickel Foam for Supercapacitor Electrodes
title_fullStr Reduced Graphene Oxide on Nickel Foam for Supercapacitor Electrodes
title_full_unstemmed Reduced Graphene Oxide on Nickel Foam for Supercapacitor Electrodes
title_short Reduced Graphene Oxide on Nickel Foam for Supercapacitor Electrodes
title_sort reduced graphene oxide on nickel foam for supercapacitor electrodes
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5706242/
https://www.ncbi.nlm.nih.gov/pubmed/29137133
http://dx.doi.org/10.3390/ma10111295
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