Cargando…
Nanometer collimation enhancement of ion beams using channeling effects in track-etched mica capillaries
Long channels with diameter of few tens of nanometer are produced by chemical track etching of swift heavy ion irradiated muscovite sheets. Such small apertures are most suitable e.g. as beam defining apertures for focusing systems in ion beam facilities enabling beam diameters down to a few nanomet...
Autores principales: | , , , , , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2017
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5719017/ https://www.ncbi.nlm.nih.gov/pubmed/29213112 http://dx.doi.org/10.1038/s41598-017-17005-w |
_version_ | 1783284416005537792 |
---|---|
author | Scheuner, Clemens Jankuhn, Steffen Vogt, Jürgen Pezzagna, Sébastien Trautmann, Christina Meijer, Jan |
author_facet | Scheuner, Clemens Jankuhn, Steffen Vogt, Jürgen Pezzagna, Sébastien Trautmann, Christina Meijer, Jan |
author_sort | Scheuner, Clemens |
collection | PubMed |
description | Long channels with diameter of few tens of nanometer are produced by chemical track etching of swift heavy ion irradiated muscovite sheets. Such small apertures are most suitable e.g. as beam defining apertures for focusing systems in ion beam facilities enabling beam diameters down to a few nanometers. One of the most important parameters to consider is the interaction of the ion beam with the walls of the aperture. We report angle-resolved transmission and energy-loss measurements of MeV ion beams through ion-track-etched capillaries with very high aspect ratio of about 60. For all ion energies, the angle-resolved transmission curves measured through the channels show a significant enhancement with respect to the expected pure geometrical considerations. This broadening of the acceptance angle increases further when the kinetic energy is reduced. This effect is ascribed to low-angle scattering of the ions at the surface of the muscovite capillary walls. These results are well described by simulations applying a similar approach as used for ion beam channeling in crystals. |
format | Online Article Text |
id | pubmed-5719017 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2017 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-57190172017-12-08 Nanometer collimation enhancement of ion beams using channeling effects in track-etched mica capillaries Scheuner, Clemens Jankuhn, Steffen Vogt, Jürgen Pezzagna, Sébastien Trautmann, Christina Meijer, Jan Sci Rep Article Long channels with diameter of few tens of nanometer are produced by chemical track etching of swift heavy ion irradiated muscovite sheets. Such small apertures are most suitable e.g. as beam defining apertures for focusing systems in ion beam facilities enabling beam diameters down to a few nanometers. One of the most important parameters to consider is the interaction of the ion beam with the walls of the aperture. We report angle-resolved transmission and energy-loss measurements of MeV ion beams through ion-track-etched capillaries with very high aspect ratio of about 60. For all ion energies, the angle-resolved transmission curves measured through the channels show a significant enhancement with respect to the expected pure geometrical considerations. This broadening of the acceptance angle increases further when the kinetic energy is reduced. This effect is ascribed to low-angle scattering of the ions at the surface of the muscovite capillary walls. These results are well described by simulations applying a similar approach as used for ion beam channeling in crystals. Nature Publishing Group UK 2017-12-06 /pmc/articles/PMC5719017/ /pubmed/29213112 http://dx.doi.org/10.1038/s41598-017-17005-w Text en © The Author(s) 2017 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Scheuner, Clemens Jankuhn, Steffen Vogt, Jürgen Pezzagna, Sébastien Trautmann, Christina Meijer, Jan Nanometer collimation enhancement of ion beams using channeling effects in track-etched mica capillaries |
title | Nanometer collimation enhancement of ion beams using channeling effects in track-etched mica capillaries |
title_full | Nanometer collimation enhancement of ion beams using channeling effects in track-etched mica capillaries |
title_fullStr | Nanometer collimation enhancement of ion beams using channeling effects in track-etched mica capillaries |
title_full_unstemmed | Nanometer collimation enhancement of ion beams using channeling effects in track-etched mica capillaries |
title_short | Nanometer collimation enhancement of ion beams using channeling effects in track-etched mica capillaries |
title_sort | nanometer collimation enhancement of ion beams using channeling effects in track-etched mica capillaries |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5719017/ https://www.ncbi.nlm.nih.gov/pubmed/29213112 http://dx.doi.org/10.1038/s41598-017-17005-w |
work_keys_str_mv | AT scheunerclemens nanometercollimationenhancementofionbeamsusingchannelingeffectsintracketchedmicacapillaries AT jankuhnsteffen nanometercollimationenhancementofionbeamsusingchannelingeffectsintracketchedmicacapillaries AT vogtjurgen nanometercollimationenhancementofionbeamsusingchannelingeffectsintracketchedmicacapillaries AT pezzagnasebastien nanometercollimationenhancementofionbeamsusingchannelingeffectsintracketchedmicacapillaries AT trautmannchristina nanometercollimationenhancementofionbeamsusingchannelingeffectsintracketchedmicacapillaries AT meijerjan nanometercollimationenhancementofionbeamsusingchannelingeffectsintracketchedmicacapillaries |