Cargando…
Diffraction gratings metrology and ray-tracing results for an XUV Raman spectrometer at FLASH
The extreme-ultraviolet double-stage imaging Raman spectrometer is a permanent experimental endstation at the plane-grating monochromator beamline branch PG1 at FLASH at DESY in Hamburg, Germany. This unique instrument covers the photon energy range from 20 to 200 eV with high energy resolution of a...
Autores principales: | Dziarzhytski, Siarhei, Siewert, Frank, Sokolov, Andrey, Gwalt, Grzegorz, Seliger, Tino, Rübhausen, Michael, Weigelt, Holger, Brenner, Günter |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2018
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5741130/ https://www.ncbi.nlm.nih.gov/pubmed/29271763 http://dx.doi.org/10.1107/S1600577517013066 |
Ejemplares similares
-
The at-wavelength metrology facility for UV- and XUV-reflection and diffraction optics at BESSY-II
por: Schäfers, F., et al.
Publicado: (2016) -
Damage thresholds for blaze diffraction gratings and grazing incidence optics at an X-ray free-electron laser
por: Krzywinski, Jacek, et al.
Publicado: (2018) -
Microfocusing at the PG1 beamline at FLASH
por: Dziarzhytski, Siarhei, et al.
Publicado: (2016) -
Gratings for synchrotron and FEL beamlines: a project for the manufacture of ultra-precise gratings at Helmholtz Zentrum Berlin
por: Siewert, F., et al.
Publicado: (2018) -
A non-invasive online photoionization spectrometer for FLASH2
por: Braune, Markus, et al.
Publicado: (2016)