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Effect of reflection and refraction on NEXAFS spectra measured in TEY mode
The evolution of near-edge X-ray absorption fine structure in the vicinity of the K-absorption edge of oxygen for HfO(2) over a wide range of incidence angles is analyzed by simultaneous implementation of the total-electron-yield (TEY) method and X-ray reflection spectroscopy. It is established that...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2018
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5741132/ https://www.ncbi.nlm.nih.gov/pubmed/29271772 http://dx.doi.org/10.1107/S1600577517016253 |