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Improvement of High-Temperature Stability of Al(2)O(3)/Pt/ZnO/Al(2)O(3) Film Electrode for SAW Devices by Using Al(2)O(3) Barrier Layer

In order to develop film electrodes for the surface acoustic wave (SAW) devices operating in harsh high-temperature environments, novel Al(2)O(3)/Pt/ZnO/Al(2)O(3) multilayered film electrodes were prepared by laser molecular beam epitaxy (LMBE) at 150 °C. The first Al(2)O(3) layer was used as a barr...

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Detalles Bibliográficos
Autores principales: Liu, Xingpeng, Peng, Bin, Zhang, Wanli, Zhu, Jun, Liu, Xingzhao, Wei, Meng
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5744312/
https://www.ncbi.nlm.nih.gov/pubmed/29194385
http://dx.doi.org/10.3390/ma10121377
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author Liu, Xingpeng
Peng, Bin
Zhang, Wanli
Zhu, Jun
Liu, Xingzhao
Wei, Meng
author_facet Liu, Xingpeng
Peng, Bin
Zhang, Wanli
Zhu, Jun
Liu, Xingzhao
Wei, Meng
author_sort Liu, Xingpeng
collection PubMed
description In order to develop film electrodes for the surface acoustic wave (SAW) devices operating in harsh high-temperature environments, novel Al(2)O(3)/Pt/ZnO/Al(2)O(3) multilayered film electrodes were prepared by laser molecular beam epitaxy (LMBE) at 150 °C. The first Al(2)O(3) layer was used as a barrier layer to prevent the diffusion of Ga, La, and Si atoms from the La(3)Ga(5)SiO(14) (LGS) substrate to the film electrode and thus improved the crystalline quality of ZnO and Pt films. It was found that the resistance of the Al(2)O(3)/Pt/ZnO/Al(2)O(3) electrode did not vary up to a temperature of 1150 °C, suggesting a high reliability of electrode under harsh high-temperature environments. The mechanism of the stable resistance of the Al(2)O(3)/Pt/ZnO/Al(2)O(3) film electrodes at high temperature was investigated by analyzing its microstructure. The proposed Al(2)O(3)/Pt/ZnO/Al(2)O(3) film electrode has great potential for application in high-temperature SAW devices.
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spelling pubmed-57443122017-12-31 Improvement of High-Temperature Stability of Al(2)O(3)/Pt/ZnO/Al(2)O(3) Film Electrode for SAW Devices by Using Al(2)O(3) Barrier Layer Liu, Xingpeng Peng, Bin Zhang, Wanli Zhu, Jun Liu, Xingzhao Wei, Meng Materials (Basel) Article In order to develop film electrodes for the surface acoustic wave (SAW) devices operating in harsh high-temperature environments, novel Al(2)O(3)/Pt/ZnO/Al(2)O(3) multilayered film electrodes were prepared by laser molecular beam epitaxy (LMBE) at 150 °C. The first Al(2)O(3) layer was used as a barrier layer to prevent the diffusion of Ga, La, and Si atoms from the La(3)Ga(5)SiO(14) (LGS) substrate to the film electrode and thus improved the crystalline quality of ZnO and Pt films. It was found that the resistance of the Al(2)O(3)/Pt/ZnO/Al(2)O(3) electrode did not vary up to a temperature of 1150 °C, suggesting a high reliability of electrode under harsh high-temperature environments. The mechanism of the stable resistance of the Al(2)O(3)/Pt/ZnO/Al(2)O(3) film electrodes at high temperature was investigated by analyzing its microstructure. The proposed Al(2)O(3)/Pt/ZnO/Al(2)O(3) film electrode has great potential for application in high-temperature SAW devices. MDPI 2017-12-01 /pmc/articles/PMC5744312/ /pubmed/29194385 http://dx.doi.org/10.3390/ma10121377 Text en © 2017 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Liu, Xingpeng
Peng, Bin
Zhang, Wanli
Zhu, Jun
Liu, Xingzhao
Wei, Meng
Improvement of High-Temperature Stability of Al(2)O(3)/Pt/ZnO/Al(2)O(3) Film Electrode for SAW Devices by Using Al(2)O(3) Barrier Layer
title Improvement of High-Temperature Stability of Al(2)O(3)/Pt/ZnO/Al(2)O(3) Film Electrode for SAW Devices by Using Al(2)O(3) Barrier Layer
title_full Improvement of High-Temperature Stability of Al(2)O(3)/Pt/ZnO/Al(2)O(3) Film Electrode for SAW Devices by Using Al(2)O(3) Barrier Layer
title_fullStr Improvement of High-Temperature Stability of Al(2)O(3)/Pt/ZnO/Al(2)O(3) Film Electrode for SAW Devices by Using Al(2)O(3) Barrier Layer
title_full_unstemmed Improvement of High-Temperature Stability of Al(2)O(3)/Pt/ZnO/Al(2)O(3) Film Electrode for SAW Devices by Using Al(2)O(3) Barrier Layer
title_short Improvement of High-Temperature Stability of Al(2)O(3)/Pt/ZnO/Al(2)O(3) Film Electrode for SAW Devices by Using Al(2)O(3) Barrier Layer
title_sort improvement of high-temperature stability of al(2)o(3)/pt/zno/al(2)o(3) film electrode for saw devices by using al(2)o(3) barrier layer
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5744312/
https://www.ncbi.nlm.nih.gov/pubmed/29194385
http://dx.doi.org/10.3390/ma10121377
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