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Exploring wear at the nanoscale with circular mode atomic force microscopy

The development of atomic force microscopy (AFM) has allowed wear mechanisms to be investigated at the nanometer scale by means of a single asperity contact generated by an AFM tip and an interacting surface. However, the low wear rate at the nanoscale and the thermal drift require fastidious quanti...

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Autores principales: Noel, Olivier, Vencl, Aleksandar, Mazeran, Pierre-Emmanuel
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5753049/
https://www.ncbi.nlm.nih.gov/pubmed/29354338
http://dx.doi.org/10.3762/bjnano.8.266
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author Noel, Olivier
Vencl, Aleksandar
Mazeran, Pierre-Emmanuel
author_facet Noel, Olivier
Vencl, Aleksandar
Mazeran, Pierre-Emmanuel
author_sort Noel, Olivier
collection PubMed
description The development of atomic force microscopy (AFM) has allowed wear mechanisms to be investigated at the nanometer scale by means of a single asperity contact generated by an AFM tip and an interacting surface. However, the low wear rate at the nanoscale and the thermal drift require fastidious quantitative measurements of the wear volume for determining wear laws. In this paper, we describe a new, effective, experimental methodology based on circular mode AFM, which generates high frequency, circular displacements of the contact. Under such conditions, the wear rate is significant and the drift of the piezoelectric actuator is limited. As a result, well-defined wear tracks are generated and an accurate computation of the wear volume is possible. Finally, we describe the advantages of this method and we report a relevant application example addressing a Cu/Al(2)O(3) nanocomposite material used in industrial applications.
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spelling pubmed-57530492018-01-19 Exploring wear at the nanoscale with circular mode atomic force microscopy Noel, Olivier Vencl, Aleksandar Mazeran, Pierre-Emmanuel Beilstein J Nanotechnol Full Research Paper The development of atomic force microscopy (AFM) has allowed wear mechanisms to be investigated at the nanometer scale by means of a single asperity contact generated by an AFM tip and an interacting surface. However, the low wear rate at the nanoscale and the thermal drift require fastidious quantitative measurements of the wear volume for determining wear laws. In this paper, we describe a new, effective, experimental methodology based on circular mode AFM, which generates high frequency, circular displacements of the contact. Under such conditions, the wear rate is significant and the drift of the piezoelectric actuator is limited. As a result, well-defined wear tracks are generated and an accurate computation of the wear volume is possible. Finally, we describe the advantages of this method and we report a relevant application example addressing a Cu/Al(2)O(3) nanocomposite material used in industrial applications. Beilstein-Institut 2017-12-11 /pmc/articles/PMC5753049/ /pubmed/29354338 http://dx.doi.org/10.3762/bjnano.8.266 Text en Copyright © 2017, Noel et al. https://creativecommons.org/licenses/by/4.0https://www.beilstein-journals.org/bjnano/termsThis is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms)
spellingShingle Full Research Paper
Noel, Olivier
Vencl, Aleksandar
Mazeran, Pierre-Emmanuel
Exploring wear at the nanoscale with circular mode atomic force microscopy
title Exploring wear at the nanoscale with circular mode atomic force microscopy
title_full Exploring wear at the nanoscale with circular mode atomic force microscopy
title_fullStr Exploring wear at the nanoscale with circular mode atomic force microscopy
title_full_unstemmed Exploring wear at the nanoscale with circular mode atomic force microscopy
title_short Exploring wear at the nanoscale with circular mode atomic force microscopy
title_sort exploring wear at the nanoscale with circular mode atomic force microscopy
topic Full Research Paper
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5753049/
https://www.ncbi.nlm.nih.gov/pubmed/29354338
http://dx.doi.org/10.3762/bjnano.8.266
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