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Exploring wear at the nanoscale with circular mode atomic force microscopy
The development of atomic force microscopy (AFM) has allowed wear mechanisms to be investigated at the nanometer scale by means of a single asperity contact generated by an AFM tip and an interacting surface. However, the low wear rate at the nanoscale and the thermal drift require fastidious quanti...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Beilstein-Institut
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5753049/ https://www.ncbi.nlm.nih.gov/pubmed/29354338 http://dx.doi.org/10.3762/bjnano.8.266 |
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author | Noel, Olivier Vencl, Aleksandar Mazeran, Pierre-Emmanuel |
author_facet | Noel, Olivier Vencl, Aleksandar Mazeran, Pierre-Emmanuel |
author_sort | Noel, Olivier |
collection | PubMed |
description | The development of atomic force microscopy (AFM) has allowed wear mechanisms to be investigated at the nanometer scale by means of a single asperity contact generated by an AFM tip and an interacting surface. However, the low wear rate at the nanoscale and the thermal drift require fastidious quantitative measurements of the wear volume for determining wear laws. In this paper, we describe a new, effective, experimental methodology based on circular mode AFM, which generates high frequency, circular displacements of the contact. Under such conditions, the wear rate is significant and the drift of the piezoelectric actuator is limited. As a result, well-defined wear tracks are generated and an accurate computation of the wear volume is possible. Finally, we describe the advantages of this method and we report a relevant application example addressing a Cu/Al(2)O(3) nanocomposite material used in industrial applications. |
format | Online Article Text |
id | pubmed-5753049 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2017 |
publisher | Beilstein-Institut |
record_format | MEDLINE/PubMed |
spelling | pubmed-57530492018-01-19 Exploring wear at the nanoscale with circular mode atomic force microscopy Noel, Olivier Vencl, Aleksandar Mazeran, Pierre-Emmanuel Beilstein J Nanotechnol Full Research Paper The development of atomic force microscopy (AFM) has allowed wear mechanisms to be investigated at the nanometer scale by means of a single asperity contact generated by an AFM tip and an interacting surface. However, the low wear rate at the nanoscale and the thermal drift require fastidious quantitative measurements of the wear volume for determining wear laws. In this paper, we describe a new, effective, experimental methodology based on circular mode AFM, which generates high frequency, circular displacements of the contact. Under such conditions, the wear rate is significant and the drift of the piezoelectric actuator is limited. As a result, well-defined wear tracks are generated and an accurate computation of the wear volume is possible. Finally, we describe the advantages of this method and we report a relevant application example addressing a Cu/Al(2)O(3) nanocomposite material used in industrial applications. Beilstein-Institut 2017-12-11 /pmc/articles/PMC5753049/ /pubmed/29354338 http://dx.doi.org/10.3762/bjnano.8.266 Text en Copyright © 2017, Noel et al. https://creativecommons.org/licenses/by/4.0https://www.beilstein-journals.org/bjnano/termsThis is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms) |
spellingShingle | Full Research Paper Noel, Olivier Vencl, Aleksandar Mazeran, Pierre-Emmanuel Exploring wear at the nanoscale with circular mode atomic force microscopy |
title | Exploring wear at the nanoscale with circular mode atomic force microscopy |
title_full | Exploring wear at the nanoscale with circular mode atomic force microscopy |
title_fullStr | Exploring wear at the nanoscale with circular mode atomic force microscopy |
title_full_unstemmed | Exploring wear at the nanoscale with circular mode atomic force microscopy |
title_short | Exploring wear at the nanoscale with circular mode atomic force microscopy |
title_sort | exploring wear at the nanoscale with circular mode atomic force microscopy |
topic | Full Research Paper |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5753049/ https://www.ncbi.nlm.nih.gov/pubmed/29354338 http://dx.doi.org/10.3762/bjnano.8.266 |
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