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Exploring wear at the nanoscale with circular mode atomic force microscopy

The development of atomic force microscopy (AFM) has allowed wear mechanisms to be investigated at the nanometer scale by means of a single asperity contact generated by an AFM tip and an interacting surface. However, the low wear rate at the nanoscale and the thermal drift require fastidious quanti...

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Detalles Bibliográficos
Autores principales:	Noel, Olivier, Vencl, Aleksandar, Mazeran, Pierre-Emmanuel
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein-Institut 2017
Materias:	Full Research Paper
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5753049/ https://www.ncbi.nlm.nih.gov/pubmed/29354338 http://dx.doi.org/10.3762/bjnano.8.266

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