Cargando…

Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy

The relaxation behaviors of thin polymer films show a strong dependence on temperature and film thickness. Direct quantitative detection of the relaxation behaviors of thin polymer films at nanometer scale by traditional instruments is however challenging. In this study, we employed atomic force mic...

Descripción completa

Detalles Bibliográficos
Autores principales:	Kang, Hua, Qian, Xiaoqin, Guan, Li, Zhang, Meining, Li, Qiang, Wu, Aoli, Dong, Mingdong
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Springer US 2018
Materias:	Nano Express
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5760485/ https://www.ncbi.nlm.nih.gov/pubmed/29318399 http://dx.doi.org/10.1186/s11671-017-2426-9

Ejemplares similares

In Situ Probing the Relaxation Properties of Ultrathin Polystyrene Films by Using Electric Force Microscopy
por: Qian, Xiaoqin, et al.
Publicado: (2017)

Atomic Force Microscopy Study of the Kinetic Roughening in Nanostructured Gold Films on SiO(2)
por: Ruffino, F, et al.
Publicado: (2009)

Nanoprocessing of layered crystalline materials by atomic force microscopy
por: Miyake, Shojiro, et al.
Publicado: (2015)

Characterization of Films with Thickness Less than 10 nm by Sensitivity-Enhanced Atomic Force Acoustic Microscopy
por: Muraoka, Mikio, et al.
Publicado: (2010)

Atomic force microscopy analysis of nanoparticles in non-ideal conditions
por: Klapetek, Petr, et al.
Publicado: (2011)

Conductive-probe atomic force microscopy characterization of silicon nanowire
por: Alvarez, José, et al.
Publicado: (2011)

Determination of electrostatic force and its characteristics based on phase difference by amplitude modulation atomic force microscopy
por: Wang, Kesheng, et al.
Publicado: (2016)

bOptimizing atomic force microscopy for characterization of diamond-protein interfaces
por: Rezek, Bohuslav, et al.
Publicado: (2011)

Quantitative Nanomechanical Mapping of Polyolefin Elastomer at Nanoscale with Atomic Force Microscopy
por: Zhang, Shuting, et al.
Publicado: (2021)

Scanned Probe Oxidation onp-GaAs(100) Surface with an Atomic Force Microscopy
por: Jian, Sheng-Rui, et al.
Publicado: (2008)

Atomic force microscopy investigation of the kinetic growth mechanisms of sputtered nanostructured Au film on mica: towards a nanoscale morphology control
por: Ruffino, Francesco, et al.
Publicado: (2011)

Comparison of immature and mature bone marrow-derived dendritic cells by atomic force microscopy
por: Xing, Feiyue, et al.
Publicado: (2011)

Studies on the electrostatic effects of stretched PVDF films and nanofibers
por: Lin, Yixuan, et al.
Publicado: (2021)

The Growth of Polarization Domains in Ultrathin Ferroelectric Films Seeded by the Tip of an Atomic Force Microscope
por: Zamani-Alavijeh, Mohammad, et al.
Publicado: (2022)

Crystallographic plane-orientation dependent atomic force microscopy-based local oxidation of silicon carbide
por: Ahn, Jung-Joon, et al.
Publicado: (2011)

The nanoscale phase distinguishing of PCL-PB-PCL blended in epoxy resin by tapping mode atomic force microscopy
por: Li, Huiqin, et al.
Publicado: (2012)

Probing Specific Interaction Forces Between Human IgG and Rat Anti-Human IgG by Self-Assembled Monolayer and Atomic Force Microscopy
por: Lv, Zhengjian, et al.
Publicado: (2010)

The current image of single SnO(2 )nanobelt nanodevice studied by conductive atomic force microscopy
por: Wang, Shujie, et al.
Publicado: (2011)

Evaluation of the nanotube intrinsic resistance across the tip-carbon nanotube-metal substrate junction by Atomic Force Microscopy
por: Dominiczak, Maguy, et al.
Publicado: (2011)

Nanopatterning on silicon surface using atomic force microscopy with diamond-like carbon (DLC)-coated Si probe
por: Jiang, Xiaohong, et al.
Publicado: (2011)

Cross-Sectional Investigations on Epitaxial Silicon Solar Cells by Kelvin and Conducting Probe Atomic Force Microscopy: Effect of Illumination
por: Narchi, Paul, et al.
Publicado: (2016)

Discrimination Between Cervical Cancer Cells and Normal Cervical Cells Based on Longitudinal Elasticity Using Atomic Force Microscopy
por: Zhao, Xueqin, et al.
Publicado: (2015)

Atomic-Layer-Deposition of Indium Oxide Nano-films for Thin-Film Transistors
por: Ma, Qian, et al.
Publicado: (2018)

The use of artificial neural networks in electrostatic force microscopy
por: Castellano-Hernández, Elena, et al.
Publicado: (2012)

Crystallographic order and decomposition of [Mn(III)(6)Cr(III)](3+) single-molecule magnets deposited in submonolayers and monolayers on HOPG studied by means of molecular resolved atomic force microscopy (AFM) and Kelvin probe force microscopy in UHV
por: Gryzia, Aaron, et al.
Publicado: (2014)

Increased conductance of individual self-assembled GeSi quantum dots by inter-dot coupling studied by conductive atomic force microscopy
por: Zhang, Yifei, et al.
Publicado: (2012)

Atomic Force Microscopy-Based Nanoscopy of Chondrogenically Differentiating Human Adipose-Derived Stem Cells: Nanostructure and Integrin β1 Expression
por: Yang, Jie, et al.
Publicado: (2018)

Hysteresis loops of individual Co nanostripes measured by magnetic force microscopy
por: Jaafar, Miriam, et al.
Publicado: (2011)

Real-time deflection and friction force imaging by bimorph-based resonance-type high-speed scanning force microscopy in the contact mode
por: Cai, Wei, et al.
Publicado: (2014)

Atomic Force Microscopy Study of Protein–Protein Interactions in the Cytochrome CYP11A1 (P450scc)-Containing Steroid Hydroxylase System
por: Ivanov, YD, et al.
Publicado: (2010)

Dynamic response of a cracked atomic force microscope cantilever used for nanomachining
por: Lee, Haw-Long, et al.
Publicado: (2012)

Nano-oxide thin films deposited via atomic layer deposition on microchannel plates
por: Yan, Baojun, et al.
Publicado: (2015)

Site-controlled quantum dots fabricated using an atomic-force microscope assisted technique
por: Song, HZ, et al.
Publicado: (2006)

Nanoscale Visualization of Elastic Inhomogeneities at TiN Coatings Using Ultrasonic Force Microscopy
por: Hidalgo, JA, et al.
Publicado: (2009)

Potential Dip in Organic Photovoltaics Probed by Cross-sectional Kelvin Probe Force Microscopy
por: Lee, Jongjin, et al.
Publicado: (2018)

Effects of Al Doping on the Properties of ZnO Thin Films Deposited by Atomic Layer Deposition
por: Zhai, Chen-Hui, et al.
Publicado: (2016)

Bi-layer Channel AZO/ZnO Thin Film Transistors Fabricated by Atomic Layer Deposition Technique
por: Li, Huijin, et al.
Publicado: (2017)

Phase-change properties of GeSbTe thin films deposited by plasma-enchanced atomic layer depositon
por: Song, Sannian, et al.
Publicado: (2015)

Identification of Characteristic Macromolecules of Escherichia coli Genotypes by Atomic Force Microscope Nanoscale Mechanical Mapping
por: Chang, Alice Chinghsuan, et al.
Publicado: (2018)

Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy
por: Slobodian, Oleksandr M., et al.
Publicado: (2018)

Cannot write session to /tmp/vufind_sessions/sess_tjms24a6c5q9glf5i7dsru6gc1