Layer number identification of CVD-grown multilayer graphene using Si peak analysis

Since the successful exfoliation of graphene, various methodologies have been developed to identify the number of layers of exfoliated graphene. The optical contrast, Raman G-peak intensity, and 2D-peak line-shape are currently widely used as the first level of inspection for graphene samples. Altho...

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Detalles Bibliográficos
Autores principales: No, You-Shin, Choi, Hong Kyw, Kim, Jin-Soo, Kim, Hakseong, Yu, Young-Jun, Choi, Choon-Gi, Choi, Jin Sik
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5766578/
https://www.ncbi.nlm.nih.gov/pubmed/29330376
http://dx.doi.org/10.1038/s41598-017-19084-1

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5766578/
https://www.ncbi.nlm.nih.gov/pubmed/29330376
http://dx.doi.org/10.1038/s41598-017-19084-1

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