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Ag-migration effects on the metastable phase in CaCu(3)Ti(4)O(12) capacitors
The silver migration effect into the metastable phase forms a micro-electric path, to enhance the relative dielectric permittivity of CaCu(3)Ti(4)O(12) ceramics for electronic devices. Controlling the sintering time uniquely develops the metastable phase of as-sintered CaCu(3)Ti(4)O(12) ceramics. A...
Autores principales: | , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5780478/ https://www.ncbi.nlm.nih.gov/pubmed/29362362 http://dx.doi.org/10.1038/s41598-018-19241-0 |
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author | Lee, Ji-Won Lee, Gun-Hyun Shin, Dong-Jin Kim, Jinhwan Jeong, Soon-Jong Koh, Jung-Hyuk |
author_facet | Lee, Ji-Won Lee, Gun-Hyun Shin, Dong-Jin Kim, Jinhwan Jeong, Soon-Jong Koh, Jung-Hyuk |
author_sort | Lee, Ji-Won |
collection | PubMed |
description | The silver migration effect into the metastable phase forms a micro-electric path, to enhance the relative dielectric permittivity of CaCu(3)Ti(4)O(12) ceramics for electronic devices. Controlling the sintering time uniquely develops the metastable phase of as-sintered CaCu(3)Ti(4)O(12) ceramics. A post-heating process that applies the migration of silver into the metastable phase increases the relative dielectric permittivity. At 1 kHz frequency, the relative dielectric permittivity at room temperature of the silver-migrated CaCu(3)Ti(4)O(12) ceramics sintered for 2 h is 565.9 × 10(3), almost 52 times higher than that of the as-sintered CaCu(3)Ti(4)O(12) ceramics. The selected area electron diffraction (SAED) patterns of the large and small grains were similar, but differed from those of the metastable region, including the grain boundary of the as-sintered CaCu(3)Ti(4)O(12) ceramics sintered for 2 h by TEM technique. This phenomenon suggests that enabling Ag-migration into the metastable phase develops a micro-electric path that improves the relative dielectric permittivity of CaCu(3)Ti(4)O(12) ceramics. |
format | Online Article Text |
id | pubmed-5780478 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-57804782018-02-06 Ag-migration effects on the metastable phase in CaCu(3)Ti(4)O(12) capacitors Lee, Ji-Won Lee, Gun-Hyun Shin, Dong-Jin Kim, Jinhwan Jeong, Soon-Jong Koh, Jung-Hyuk Sci Rep Article The silver migration effect into the metastable phase forms a micro-electric path, to enhance the relative dielectric permittivity of CaCu(3)Ti(4)O(12) ceramics for electronic devices. Controlling the sintering time uniquely develops the metastable phase of as-sintered CaCu(3)Ti(4)O(12) ceramics. A post-heating process that applies the migration of silver into the metastable phase increases the relative dielectric permittivity. At 1 kHz frequency, the relative dielectric permittivity at room temperature of the silver-migrated CaCu(3)Ti(4)O(12) ceramics sintered for 2 h is 565.9 × 10(3), almost 52 times higher than that of the as-sintered CaCu(3)Ti(4)O(12) ceramics. The selected area electron diffraction (SAED) patterns of the large and small grains were similar, but differed from those of the metastable region, including the grain boundary of the as-sintered CaCu(3)Ti(4)O(12) ceramics sintered for 2 h by TEM technique. This phenomenon suggests that enabling Ag-migration into the metastable phase develops a micro-electric path that improves the relative dielectric permittivity of CaCu(3)Ti(4)O(12) ceramics. Nature Publishing Group UK 2018-01-23 /pmc/articles/PMC5780478/ /pubmed/29362362 http://dx.doi.org/10.1038/s41598-018-19241-0 Text en © The Author(s) 2018 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Lee, Ji-Won Lee, Gun-Hyun Shin, Dong-Jin Kim, Jinhwan Jeong, Soon-Jong Koh, Jung-Hyuk Ag-migration effects on the metastable phase in CaCu(3)Ti(4)O(12) capacitors |
title | Ag-migration effects on the metastable phase in CaCu(3)Ti(4)O(12) capacitors |
title_full | Ag-migration effects on the metastable phase in CaCu(3)Ti(4)O(12) capacitors |
title_fullStr | Ag-migration effects on the metastable phase in CaCu(3)Ti(4)O(12) capacitors |
title_full_unstemmed | Ag-migration effects on the metastable phase in CaCu(3)Ti(4)O(12) capacitors |
title_short | Ag-migration effects on the metastable phase in CaCu(3)Ti(4)O(12) capacitors |
title_sort | ag-migration effects on the metastable phase in cacu(3)ti(4)o(12) capacitors |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5780478/ https://www.ncbi.nlm.nih.gov/pubmed/29362362 http://dx.doi.org/10.1038/s41598-018-19241-0 |
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