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High-Temperature Raman Spectroscopy of Nano-Crystalline Carbon in Silicon Oxycarbide
The microstructure of segregated carbon in silicon oxycarbide (SiOC), hot-pressed at T = 1600 °C and p = 50 MPa, has been investigated by VIS Raman spectroscopy (λ = 514 nm) within the temperature range 25–1000 °C in air. The occurrence of the G, D’ and D bands at 1590, 1620 and 1350 cm(−1), togethe...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2018
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5793591/ https://www.ncbi.nlm.nih.gov/pubmed/29315211 http://dx.doi.org/10.3390/ma11010093 |