Impact of thickness variation on structural, dielectric and piezoelectric properties of (Ba,Ca)(Ti,Zr)O(3) epitaxial thin films

It is shown that the dielectric and piezoelectric properties of Ba(Ti(0.8)Zr(0.2))O(3)-x(Ba(0.7)Ca(0.3))TiO(3) (x = 0.45) (BCTZ 45) epitaxial thin films have a nontrivial dependence on film thickness. BCTZ 45 epitaxial films with different thicknesses (up to 400 nm) have been deposited on SrTiO(3) b...

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Autores principales: Ion, Valentin, Craciun, Floriana, Scarisoreanu, Nicu D., Moldovan, Antoniu, Andrei, Andreea, Birjega, Ruxandra, Ghica, Corneliu, Di Pietrantonio, Fabio, Cannata, Domenico, Benetti, Massimiliano, Dinescu, Maria
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5794999/
https://www.ncbi.nlm.nih.gov/pubmed/29391405
http://dx.doi.org/10.1038/s41598-018-20149-y
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author Ion, Valentin
Craciun, Floriana
Scarisoreanu, Nicu D.
Moldovan, Antoniu
Andrei, Andreea
Birjega, Ruxandra
Ghica, Corneliu
Di Pietrantonio, Fabio
Cannata, Domenico
Benetti, Massimiliano
Dinescu, Maria
author_facet Ion, Valentin
Craciun, Floriana
Scarisoreanu, Nicu D.
Moldovan, Antoniu
Andrei, Andreea
Birjega, Ruxandra
Ghica, Corneliu
Di Pietrantonio, Fabio
Cannata, Domenico
Benetti, Massimiliano
Dinescu, Maria
author_sort Ion, Valentin
collection PubMed
description It is shown that the dielectric and piezoelectric properties of Ba(Ti(0.8)Zr(0.2))O(3)-x(Ba(0.7)Ca(0.3))TiO(3) (x = 0.45) (BCTZ 45) epitaxial thin films have a nontrivial dependence on film thickness. BCTZ 45 epitaxial films with different thicknesses (up to 400 nm) have been deposited on SrTiO(3) by pulsed laser deposition and investigated by different combined techniques: conventional and off-axis X-ray diffraction, high resolution transmission electron microscopy and dielectric and piezoforce microscopy. The changes occurring in epitaxial films when their thickness increases have been attributed to a partial relaxation of misfit strain, driving the induced tetragonal symmetry in very thin films to the original rhombohedral symmetry of the bulk material in the thickest film, which influences directly and indirectly the dielectric and piezoelectric properties.
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spelling pubmed-57949992018-02-12 Impact of thickness variation on structural, dielectric and piezoelectric properties of (Ba,Ca)(Ti,Zr)O(3) epitaxial thin films Ion, Valentin Craciun, Floriana Scarisoreanu, Nicu D. Moldovan, Antoniu Andrei, Andreea Birjega, Ruxandra Ghica, Corneliu Di Pietrantonio, Fabio Cannata, Domenico Benetti, Massimiliano Dinescu, Maria Sci Rep Article It is shown that the dielectric and piezoelectric properties of Ba(Ti(0.8)Zr(0.2))O(3)-x(Ba(0.7)Ca(0.3))TiO(3) (x = 0.45) (BCTZ 45) epitaxial thin films have a nontrivial dependence on film thickness. BCTZ 45 epitaxial films with different thicknesses (up to 400 nm) have been deposited on SrTiO(3) by pulsed laser deposition and investigated by different combined techniques: conventional and off-axis X-ray diffraction, high resolution transmission electron microscopy and dielectric and piezoforce microscopy. The changes occurring in epitaxial films when their thickness increases have been attributed to a partial relaxation of misfit strain, driving the induced tetragonal symmetry in very thin films to the original rhombohedral symmetry of the bulk material in the thickest film, which influences directly and indirectly the dielectric and piezoelectric properties. Nature Publishing Group UK 2018-02-01 /pmc/articles/PMC5794999/ /pubmed/29391405 http://dx.doi.org/10.1038/s41598-018-20149-y Text en © The Author(s) 2018 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Ion, Valentin
Craciun, Floriana
Scarisoreanu, Nicu D.
Moldovan, Antoniu
Andrei, Andreea
Birjega, Ruxandra
Ghica, Corneliu
Di Pietrantonio, Fabio
Cannata, Domenico
Benetti, Massimiliano
Dinescu, Maria
Impact of thickness variation on structural, dielectric and piezoelectric properties of (Ba,Ca)(Ti,Zr)O(3) epitaxial thin films
title Impact of thickness variation on structural, dielectric and piezoelectric properties of (Ba,Ca)(Ti,Zr)O(3) epitaxial thin films
title_full Impact of thickness variation on structural, dielectric and piezoelectric properties of (Ba,Ca)(Ti,Zr)O(3) epitaxial thin films
title_fullStr Impact of thickness variation on structural, dielectric and piezoelectric properties of (Ba,Ca)(Ti,Zr)O(3) epitaxial thin films
title_full_unstemmed Impact of thickness variation on structural, dielectric and piezoelectric properties of (Ba,Ca)(Ti,Zr)O(3) epitaxial thin films
title_short Impact of thickness variation on structural, dielectric and piezoelectric properties of (Ba,Ca)(Ti,Zr)O(3) epitaxial thin films
title_sort impact of thickness variation on structural, dielectric and piezoelectric properties of (ba,ca)(ti,zr)o(3) epitaxial thin films
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5794999/
https://www.ncbi.nlm.nih.gov/pubmed/29391405
http://dx.doi.org/10.1038/s41598-018-20149-y
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