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Distance Calibration between Reference Plane and Screen in Direct Phase Measuring Deflectometry
The recently developed direct phase measuring deflectometry (DPMD) method can directly measure the three-dimensional (3D) shape of specular objects with discontinuous surfaces, but requires a calibrated distance between a reference plane and liquid crystal display screen. Because the plane and scree...
Autores principales: | , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5795509/ https://www.ncbi.nlm.nih.gov/pubmed/29316627 http://dx.doi.org/10.3390/s18010144 |
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author | Huang, Shujun Liu, Yue Gao, Nan Zhang, Zonghua Gao, Feng Jiang, Xiangqian |
author_facet | Huang, Shujun Liu, Yue Gao, Nan Zhang, Zonghua Gao, Feng Jiang, Xiangqian |
author_sort | Huang, Shujun |
collection | PubMed |
description | The recently developed direct phase measuring deflectometry (DPMD) method can directly measure the three-dimensional (3D) shape of specular objects with discontinuous surfaces, but requires a calibrated distance between a reference plane and liquid crystal display screen. Because the plane and screen are different distances from the imaging device, they cannot be clearly captured given the limited depth of field (DOF) of the lens. Therefore, existing machine vision-based methods cannot be used to effectively calibrate a DPMD system. In this paper, a new distance calibration method that uses a mirror with a hollow ring matrix pattern and a mobile stage is presented. The direction of the mobile stage in the camera coordinate system is determined by the mirror’s pattern at several positions in the camera’s DOF so that the reference position outside of the DOF can be calculated. The screen’s position can also be calibrated by displaying patterns at a known scale. Therefore, the required distance is accurately obtained in the camera coordinate system. Evaluation results show that the maximum value of the absolute error is less than 0.031 mm. The experimental results on an artificial stepped mirror and a reflected diamond distribution surface demonstrate the accuracy and practicality of the proposed method. |
format | Online Article Text |
id | pubmed-5795509 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-57955092018-02-13 Distance Calibration between Reference Plane and Screen in Direct Phase Measuring Deflectometry Huang, Shujun Liu, Yue Gao, Nan Zhang, Zonghua Gao, Feng Jiang, Xiangqian Sensors (Basel) Article The recently developed direct phase measuring deflectometry (DPMD) method can directly measure the three-dimensional (3D) shape of specular objects with discontinuous surfaces, but requires a calibrated distance between a reference plane and liquid crystal display screen. Because the plane and screen are different distances from the imaging device, they cannot be clearly captured given the limited depth of field (DOF) of the lens. Therefore, existing machine vision-based methods cannot be used to effectively calibrate a DPMD system. In this paper, a new distance calibration method that uses a mirror with a hollow ring matrix pattern and a mobile stage is presented. The direction of the mobile stage in the camera coordinate system is determined by the mirror’s pattern at several positions in the camera’s DOF so that the reference position outside of the DOF can be calculated. The screen’s position can also be calibrated by displaying patterns at a known scale. Therefore, the required distance is accurately obtained in the camera coordinate system. Evaluation results show that the maximum value of the absolute error is less than 0.031 mm. The experimental results on an artificial stepped mirror and a reflected diamond distribution surface demonstrate the accuracy and practicality of the proposed method. MDPI 2018-01-06 /pmc/articles/PMC5795509/ /pubmed/29316627 http://dx.doi.org/10.3390/s18010144 Text en © 2018 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Huang, Shujun Liu, Yue Gao, Nan Zhang, Zonghua Gao, Feng Jiang, Xiangqian Distance Calibration between Reference Plane and Screen in Direct Phase Measuring Deflectometry |
title | Distance Calibration between Reference Plane and Screen in Direct Phase Measuring Deflectometry |
title_full | Distance Calibration between Reference Plane and Screen in Direct Phase Measuring Deflectometry |
title_fullStr | Distance Calibration between Reference Plane and Screen in Direct Phase Measuring Deflectometry |
title_full_unstemmed | Distance Calibration between Reference Plane and Screen in Direct Phase Measuring Deflectometry |
title_short | Distance Calibration between Reference Plane and Screen in Direct Phase Measuring Deflectometry |
title_sort | distance calibration between reference plane and screen in direct phase measuring deflectometry |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5795509/ https://www.ncbi.nlm.nih.gov/pubmed/29316627 http://dx.doi.org/10.3390/s18010144 |
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