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Phase contrast scanning transmission electron microscopy imaging of light and heavy atoms at the limit of contrast and resolution

Using state of the art scanning transmission electron microscopy (STEM) it is nowadays possible to directly image single atomic columns at sub-Å resolution. In standard (high angle) annular dark field STEM ((HA)ADF-STEM), however, light elements are usually invisible when imaged together with heavie...

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Detalles Bibliográficos
Autores principales:	Yücelen, Emrah, Lazić, Ivan, Bosch, Eric G. T.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Nature Publishing Group UK 2018
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5805791/ https://www.ncbi.nlm.nih.gov/pubmed/29422551 http://dx.doi.org/10.1038/s41598-018-20377-2

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