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Distortion-free measurement of electric field strength with a MEMS sensor
Small-scale and distortion-free measurement of electric fields is crucial for applications such as surveying atmospheric electrostatic fields, lightning research, and safeguarding areas close to high-voltage power lines. A variety of measurement systems exist, the most common of which are field mill...
Autores principales: | , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5824978/ https://www.ncbi.nlm.nih.gov/pubmed/29485145 http://dx.doi.org/10.1038/s41928-017-0009-5 |
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author | Kainz, Andreas Steiner, Harald Schalko, Johannes Jachimowicz, Artur Kohl, Franz Stifter, Michael Beigelbeck, Roman Keplinger, Franz Hortschitz, Wilfried |
author_facet | Kainz, Andreas Steiner, Harald Schalko, Johannes Jachimowicz, Artur Kohl, Franz Stifter, Michael Beigelbeck, Roman Keplinger, Franz Hortschitz, Wilfried |
author_sort | Kainz, Andreas |
collection | PubMed |
description | Small-scale and distortion-free measurement of electric fields is crucial for applications such as surveying atmospheric electrostatic fields, lightning research, and safeguarding areas close to high-voltage power lines. A variety of measurement systems exist, the most common of which are field mills, which work by picking up the differential voltage of the measurement electrodes while periodically shielding them with a grounded electrode. However, all current approaches are either bulky, suffer from a strong temperature dependency, or severely distort the electric field requiring a well-defined surrounding and complex calibration procedures. Here we show that microelectromechanical system (MEMS) devices can be used to measure electric field strength without significant field distortion. The purely passive MEMS devices exploit the effect of electrostatic induction, which is used to generate internal forces that are converted into an optically tracked mechanical displacement of a spring-suspended seismic mass. The devices exhibit resolutions on the order of [Formula: see text] with a measurement range of up to tens of kilovolt per metre in the quasi-static regime (≲ 300 Hz).We also show that it should be possible to achieve resolutions of around [Formula: see text] by fine-tuning of the sensor embodiment. These MEMS devices are compact and could easily be mass produced for wide application. |
format | Online Article Text |
id | pubmed-5824978 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
record_format | MEDLINE/PubMed |
spelling | pubmed-58249782018-07-08 Distortion-free measurement of electric field strength with a MEMS sensor Kainz, Andreas Steiner, Harald Schalko, Johannes Jachimowicz, Artur Kohl, Franz Stifter, Michael Beigelbeck, Roman Keplinger, Franz Hortschitz, Wilfried Nat Electron Article Small-scale and distortion-free measurement of electric fields is crucial for applications such as surveying atmospheric electrostatic fields, lightning research, and safeguarding areas close to high-voltage power lines. A variety of measurement systems exist, the most common of which are field mills, which work by picking up the differential voltage of the measurement electrodes while periodically shielding them with a grounded electrode. However, all current approaches are either bulky, suffer from a strong temperature dependency, or severely distort the electric field requiring a well-defined surrounding and complex calibration procedures. Here we show that microelectromechanical system (MEMS) devices can be used to measure electric field strength without significant field distortion. The purely passive MEMS devices exploit the effect of electrostatic induction, which is used to generate internal forces that are converted into an optically tracked mechanical displacement of a spring-suspended seismic mass. The devices exhibit resolutions on the order of [Formula: see text] with a measurement range of up to tens of kilovolt per metre in the quasi-static regime (≲ 300 Hz).We also show that it should be possible to achieve resolutions of around [Formula: see text] by fine-tuning of the sensor embodiment. These MEMS devices are compact and could easily be mass produced for wide application. 2018-01-08 /pmc/articles/PMC5824978/ /pubmed/29485145 http://dx.doi.org/10.1038/s41928-017-0009-5 Text en Users may view, print, copy, and download text and data-mine the content in such documents, for the purposes of academic research, subject always to the full Conditions of use:http://www.nature.com/authors/editorial_policies/license.html#terms |
spellingShingle | Article Kainz, Andreas Steiner, Harald Schalko, Johannes Jachimowicz, Artur Kohl, Franz Stifter, Michael Beigelbeck, Roman Keplinger, Franz Hortschitz, Wilfried Distortion-free measurement of electric field strength with a MEMS sensor |
title | Distortion-free measurement of electric field strength with a MEMS
sensor |
title_full | Distortion-free measurement of electric field strength with a MEMS
sensor |
title_fullStr | Distortion-free measurement of electric field strength with a MEMS
sensor |
title_full_unstemmed | Distortion-free measurement of electric field strength with a MEMS
sensor |
title_short | Distortion-free measurement of electric field strength with a MEMS
sensor |
title_sort | distortion-free measurement of electric field strength with a mems
sensor |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5824978/ https://www.ncbi.nlm.nih.gov/pubmed/29485145 http://dx.doi.org/10.1038/s41928-017-0009-5 |
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