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Distortion-free measurement of electric field strength with a MEMS sensor

Small-scale and distortion-free measurement of electric fields is crucial for applications such as surveying atmospheric electrostatic fields, lightning research, and safeguarding areas close to high-voltage power lines. A variety of measurement systems exist, the most common of which are field mill...

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Autores principales: Kainz, Andreas, Steiner, Harald, Schalko, Johannes, Jachimowicz, Artur, Kohl, Franz, Stifter, Michael, Beigelbeck, Roman, Keplinger, Franz, Hortschitz, Wilfried
Formato: Online Artículo Texto
Lenguaje:English
Publicado: 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5824978/
https://www.ncbi.nlm.nih.gov/pubmed/29485145
http://dx.doi.org/10.1038/s41928-017-0009-5
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author Kainz, Andreas
Steiner, Harald
Schalko, Johannes
Jachimowicz, Artur
Kohl, Franz
Stifter, Michael
Beigelbeck, Roman
Keplinger, Franz
Hortschitz, Wilfried
author_facet Kainz, Andreas
Steiner, Harald
Schalko, Johannes
Jachimowicz, Artur
Kohl, Franz
Stifter, Michael
Beigelbeck, Roman
Keplinger, Franz
Hortschitz, Wilfried
author_sort Kainz, Andreas
collection PubMed
description Small-scale and distortion-free measurement of electric fields is crucial for applications such as surveying atmospheric electrostatic fields, lightning research, and safeguarding areas close to high-voltage power lines. A variety of measurement systems exist, the most common of which are field mills, which work by picking up the differential voltage of the measurement electrodes while periodically shielding them with a grounded electrode. However, all current approaches are either bulky, suffer from a strong temperature dependency, or severely distort the electric field requiring a well-defined surrounding and complex calibration procedures. Here we show that microelectromechanical system (MEMS) devices can be used to measure electric field strength without significant field distortion. The purely passive MEMS devices exploit the effect of electrostatic induction, which is used to generate internal forces that are converted into an optically tracked mechanical displacement of a spring-suspended seismic mass. The devices exhibit resolutions on the order of [Formula: see text] with a measurement range of up to tens of kilovolt per metre in the quasi-static regime (≲ 300 Hz).We also show that it should be possible to achieve resolutions of around [Formula: see text] by fine-tuning of the sensor embodiment. These MEMS devices are compact and could easily be mass produced for wide application.
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spelling pubmed-58249782018-07-08 Distortion-free measurement of electric field strength with a MEMS sensor Kainz, Andreas Steiner, Harald Schalko, Johannes Jachimowicz, Artur Kohl, Franz Stifter, Michael Beigelbeck, Roman Keplinger, Franz Hortschitz, Wilfried Nat Electron Article Small-scale and distortion-free measurement of electric fields is crucial for applications such as surveying atmospheric electrostatic fields, lightning research, and safeguarding areas close to high-voltage power lines. A variety of measurement systems exist, the most common of which are field mills, which work by picking up the differential voltage of the measurement electrodes while periodically shielding them with a grounded electrode. However, all current approaches are either bulky, suffer from a strong temperature dependency, or severely distort the electric field requiring a well-defined surrounding and complex calibration procedures. Here we show that microelectromechanical system (MEMS) devices can be used to measure electric field strength without significant field distortion. The purely passive MEMS devices exploit the effect of electrostatic induction, which is used to generate internal forces that are converted into an optically tracked mechanical displacement of a spring-suspended seismic mass. The devices exhibit resolutions on the order of [Formula: see text] with a measurement range of up to tens of kilovolt per metre in the quasi-static regime (≲ 300 Hz).We also show that it should be possible to achieve resolutions of around [Formula: see text] by fine-tuning of the sensor embodiment. These MEMS devices are compact and could easily be mass produced for wide application. 2018-01-08 /pmc/articles/PMC5824978/ /pubmed/29485145 http://dx.doi.org/10.1038/s41928-017-0009-5 Text en Users may view, print, copy, and download text and data-mine the content in such documents, for the purposes of academic research, subject always to the full Conditions of use:http://www.nature.com/authors/editorial_policies/license.html#terms
spellingShingle Article
Kainz, Andreas
Steiner, Harald
Schalko, Johannes
Jachimowicz, Artur
Kohl, Franz
Stifter, Michael
Beigelbeck, Roman
Keplinger, Franz
Hortschitz, Wilfried
Distortion-free measurement of electric field strength with a MEMS sensor
title Distortion-free measurement of electric field strength with a MEMS sensor
title_full Distortion-free measurement of electric field strength with a MEMS sensor
title_fullStr Distortion-free measurement of electric field strength with a MEMS sensor
title_full_unstemmed Distortion-free measurement of electric field strength with a MEMS sensor
title_short Distortion-free measurement of electric field strength with a MEMS sensor
title_sort distortion-free measurement of electric field strength with a mems sensor
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5824978/
https://www.ncbi.nlm.nih.gov/pubmed/29485145
http://dx.doi.org/10.1038/s41928-017-0009-5
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