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Nanoscale Probing of Interaction in Atomically Thin Layered Materials

[Image: see text] We combine conductive atomic force microscopy (CAFM) and molecular dynamics (MD) simulations to reveal the interaction of atomically thin layered materials (ATLMs) down to nanoscale lateral dimension. The setup also allows quantifying, for the first time, the effect of layer number...

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Detalles Bibliográficos
Autores principales:	Rokni, Hossein, Lu, Wei
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	American Chemical Society 2018
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5833011/ https://www.ncbi.nlm.nih.gov/pubmed/29532029 http://dx.doi.org/10.1021/acscentsci.7b00590

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