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Microscopic charge fluctuations cause minimal contrast loss in cryoEM
The fluctuating granularity or “bee swarm” effect seen in highly defocussed transmission electron micrographs is caused by microscopic charge fluctuations in the specimen created by the illuminating beam. In the field of high-resolution single particle electron cryomicroscopy (cryoEM), there has bee...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Elsevier
2018
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5862660/ https://www.ncbi.nlm.nih.gov/pubmed/29413413 http://dx.doi.org/10.1016/j.ultramic.2018.01.011 |