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Degradation of blue-phosphorescent organic light-emitting devices involves exciton-induced generation of polaron pair within emitting layers
Degradation of organic materials is responsible for the short operation lifetimes of organic light-emitting devices, but the mechanism by which such degradation is initiated has yet to be fully established. Here we report a new mechanism for degradation of emitting layers in blue-phosphorescent devi...
Autores principales: | , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5865184/ https://www.ncbi.nlm.nih.gov/pubmed/29572485 http://dx.doi.org/10.1038/s41467-018-03602-4 |
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author | Kim, Sinheui Bae, Hye Jin Park, Sangho Kim, Wook Kim, Joonghyuk Kim, Jong Soo Jung, Yongsik Sul, Soohwan Ihn, Soo-Ghang Noh, Changho Kim, Sunghan You, Youngmin |
author_facet | Kim, Sinheui Bae, Hye Jin Park, Sangho Kim, Wook Kim, Joonghyuk Kim, Jong Soo Jung, Yongsik Sul, Soohwan Ihn, Soo-Ghang Noh, Changho Kim, Sunghan You, Youngmin |
author_sort | Kim, Sinheui |
collection | PubMed |
description | Degradation of organic materials is responsible for the short operation lifetimes of organic light-emitting devices, but the mechanism by which such degradation is initiated has yet to be fully established. Here we report a new mechanism for degradation of emitting layers in blue-phosphorescent devices. We investigate binary mixtures of a wide bandgap host and a series of novel Ir(III) complex dopants having N-heterocyclocarbenic ligands. Our mechanistic study reveals the charge-neutral generation of polaron pairs (radical ion pairs) by electron transfer from the dopant to host excitons. Annihilation of the radical ion pair occurs by charge recombination, with such annihilation competing with bond scission. Device lifetime correlates linearly with the rate constant for the annihilation of the radical ion pair. Our findings demonstrate the importance of controlling exciton-induced electron transfer, and provide novel strategies to design materials for long-lifetime blue electrophosphorescence devices. |
format | Online Article Text |
id | pubmed-5865184 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-58651842018-03-28 Degradation of blue-phosphorescent organic light-emitting devices involves exciton-induced generation of polaron pair within emitting layers Kim, Sinheui Bae, Hye Jin Park, Sangho Kim, Wook Kim, Joonghyuk Kim, Jong Soo Jung, Yongsik Sul, Soohwan Ihn, Soo-Ghang Noh, Changho Kim, Sunghan You, Youngmin Nat Commun Article Degradation of organic materials is responsible for the short operation lifetimes of organic light-emitting devices, but the mechanism by which such degradation is initiated has yet to be fully established. Here we report a new mechanism for degradation of emitting layers in blue-phosphorescent devices. We investigate binary mixtures of a wide bandgap host and a series of novel Ir(III) complex dopants having N-heterocyclocarbenic ligands. Our mechanistic study reveals the charge-neutral generation of polaron pairs (radical ion pairs) by electron transfer from the dopant to host excitons. Annihilation of the radical ion pair occurs by charge recombination, with such annihilation competing with bond scission. Device lifetime correlates linearly with the rate constant for the annihilation of the radical ion pair. Our findings demonstrate the importance of controlling exciton-induced electron transfer, and provide novel strategies to design materials for long-lifetime blue electrophosphorescence devices. Nature Publishing Group UK 2018-03-23 /pmc/articles/PMC5865184/ /pubmed/29572485 http://dx.doi.org/10.1038/s41467-018-03602-4 Text en © The Author(s) 2018 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Kim, Sinheui Bae, Hye Jin Park, Sangho Kim, Wook Kim, Joonghyuk Kim, Jong Soo Jung, Yongsik Sul, Soohwan Ihn, Soo-Ghang Noh, Changho Kim, Sunghan You, Youngmin Degradation of blue-phosphorescent organic light-emitting devices involves exciton-induced generation of polaron pair within emitting layers |
title | Degradation of blue-phosphorescent organic light-emitting devices involves exciton-induced generation of polaron pair within emitting layers |
title_full | Degradation of blue-phosphorescent organic light-emitting devices involves exciton-induced generation of polaron pair within emitting layers |
title_fullStr | Degradation of blue-phosphorescent organic light-emitting devices involves exciton-induced generation of polaron pair within emitting layers |
title_full_unstemmed | Degradation of blue-phosphorescent organic light-emitting devices involves exciton-induced generation of polaron pair within emitting layers |
title_short | Degradation of blue-phosphorescent organic light-emitting devices involves exciton-induced generation of polaron pair within emitting layers |
title_sort | degradation of blue-phosphorescent organic light-emitting devices involves exciton-induced generation of polaron pair within emitting layers |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5865184/ https://www.ncbi.nlm.nih.gov/pubmed/29572485 http://dx.doi.org/10.1038/s41467-018-03602-4 |
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