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Scanning speed phenomenon in contact-resonance atomic force microscopy

This work presents data confirming the existence of a scan speed related phenomenon in contact-mode atomic force microscopy (AFM). Specifically, contact-resonance spectroscopy is used to interrogate this phenomenon. Above a critical scan speed, a monotonic decrease in the recorded contact-resonance...

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Detalles Bibliográficos
Autores principales:	Glover, Christopher C, Killgore, Jason P, Tung, Ryan C
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein-Institut 2018
Materias:	Full Research Paper
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5870161/ https://www.ncbi.nlm.nih.gov/pubmed/29600154 http://dx.doi.org/10.3762/bjnano.9.87

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