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Asymmetric electric field screening in van der Waals heterostructures

A long-standing challenge facing the combination of two-dimensional crystals into heterojunction is the unknown effect of mixing layer of different electronic properties (semiconductors, metals, insulators) on the screening features of the fabricated device platforms including their functionality. H...

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Autores principales: Li, Lu Hua, Tian, Tian, Cai, Qiran, Shih, Chih-Jen, Santos, Elton J. G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5871878/
https://www.ncbi.nlm.nih.gov/pubmed/29593279
http://dx.doi.org/10.1038/s41467-018-03592-3
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author Li, Lu Hua
Tian, Tian
Cai, Qiran
Shih, Chih-Jen
Santos, Elton J. G.
author_facet Li, Lu Hua
Tian, Tian
Cai, Qiran
Shih, Chih-Jen
Santos, Elton J. G.
author_sort Li, Lu Hua
collection PubMed
description A long-standing challenge facing the combination of two-dimensional crystals into heterojunction is the unknown effect of mixing layer of different electronic properties (semiconductors, metals, insulators) on the screening features of the fabricated device platforms including their functionality. Here we use a compelling set of theoretical and experimental techniques to elucidate the intrinsic dielectric screening properties of heterostructures formed by MoS(2) and graphene layers. We experimentally observed an asymmetric field screening effect relative to the polarization of the applied gate bias into the surface. Surprisingly, such behavior allows selection of the electronic states that screen external fields, and it can be enhanced with increasing of the number of layers of the semiconducting MoS(2) rather than the semi-metal. This work not only provides unique insights on the screening properties of a vast amount of heterojunction fabricated so far, but also uncovers the great potential of controlling a fundamental property for device applications.
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spelling pubmed-58718782018-03-29 Asymmetric electric field screening in van der Waals heterostructures Li, Lu Hua Tian, Tian Cai, Qiran Shih, Chih-Jen Santos, Elton J. G. Nat Commun Article A long-standing challenge facing the combination of two-dimensional crystals into heterojunction is the unknown effect of mixing layer of different electronic properties (semiconductors, metals, insulators) on the screening features of the fabricated device platforms including their functionality. Here we use a compelling set of theoretical and experimental techniques to elucidate the intrinsic dielectric screening properties of heterostructures formed by MoS(2) and graphene layers. We experimentally observed an asymmetric field screening effect relative to the polarization of the applied gate bias into the surface. Surprisingly, such behavior allows selection of the electronic states that screen external fields, and it can be enhanced with increasing of the number of layers of the semiconducting MoS(2) rather than the semi-metal. This work not only provides unique insights on the screening properties of a vast amount of heterojunction fabricated so far, but also uncovers the great potential of controlling a fundamental property for device applications. Nature Publishing Group UK 2018-03-28 /pmc/articles/PMC5871878/ /pubmed/29593279 http://dx.doi.org/10.1038/s41467-018-03592-3 Text en © The Author(s) 2018 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Li, Lu Hua
Tian, Tian
Cai, Qiran
Shih, Chih-Jen
Santos, Elton J. G.
Asymmetric electric field screening in van der Waals heterostructures
title Asymmetric electric field screening in van der Waals heterostructures
title_full Asymmetric electric field screening in van der Waals heterostructures
title_fullStr Asymmetric electric field screening in van der Waals heterostructures
title_full_unstemmed Asymmetric electric field screening in van der Waals heterostructures
title_short Asymmetric electric field screening in van der Waals heterostructures
title_sort asymmetric electric field screening in van der waals heterostructures
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5871878/
https://www.ncbi.nlm.nih.gov/pubmed/29593279
http://dx.doi.org/10.1038/s41467-018-03592-3
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