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An analysis of the ArcCHECK‐MR diode array's performance for ViewRay quality assurance
The ArcCHECK‐MR diode array utilizes a correction system with a virtual inclinometer to correct the angular response dependencies of the diodes. However, this correction system cannot be applied to measurements on the ViewRay MR‐IGRT system due to the virtual inclinometer's incompatibility with...
Autores principales: | Ellefson, Steven T., Culberson, Wesley S., Bednarz, Bryan P., DeWerd, Larry A., Bayouth, John E. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
John Wiley and Sons Inc.
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5874930/ https://www.ncbi.nlm.nih.gov/pubmed/28681448 http://dx.doi.org/10.1002/acm2.12107 |
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