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Two-dimensional electronic transport and surface electron accumulation in MoS(2)
Because the surface-to-volume ratio of quasi-two-dimensional materials is extremely high, understanding their surface characteristics is crucial for practically controlling their intrinsic properties and fabricating p-type and n-type layered semiconductors. Van der Waals crystals are expected to hav...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5897365/ https://www.ncbi.nlm.nih.gov/pubmed/29650960 http://dx.doi.org/10.1038/s41467-018-03824-6 |
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author | Siao, M. D. Shen, W. C. Chen, R. S. Chang, Z. W. Shih, M. C. Chiu, Y. P. Cheng, C.-M. |
author_facet | Siao, M. D. Shen, W. C. Chen, R. S. Chang, Z. W. Shih, M. C. Chiu, Y. P. Cheng, C.-M. |
author_sort | Siao, M. D. |
collection | PubMed |
description | Because the surface-to-volume ratio of quasi-two-dimensional materials is extremely high, understanding their surface characteristics is crucial for practically controlling their intrinsic properties and fabricating p-type and n-type layered semiconductors. Van der Waals crystals are expected to have an inert surface because of the absence of dangling bonds. However, here we show that the surface of high-quality synthesized molybdenum disulfide (MoS(2)) is a major n-doping source. The surface electron concentration of MoS(2) is nearly four orders of magnitude higher than that of its inner bulk. Substantial thickness-dependent conductivity in MoS(2) nanoflakes was observed. The transfer length method suggested the current transport in MoS(2) following a two-dimensional behavior rather than the conventional three-dimensional mode. Scanning tunneling microscopy and angle-resolved photoemission spectroscopy measurements confirmed the presence of surface electron accumulation in this layered material. Notably, the in situ-cleaved surface exhibited a nearly intrinsic state without electron accumulation. |
format | Online Article Text |
id | pubmed-5897365 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-58973652018-04-16 Two-dimensional electronic transport and surface electron accumulation in MoS(2) Siao, M. D. Shen, W. C. Chen, R. S. Chang, Z. W. Shih, M. C. Chiu, Y. P. Cheng, C.-M. Nat Commun Article Because the surface-to-volume ratio of quasi-two-dimensional materials is extremely high, understanding their surface characteristics is crucial for practically controlling their intrinsic properties and fabricating p-type and n-type layered semiconductors. Van der Waals crystals are expected to have an inert surface because of the absence of dangling bonds. However, here we show that the surface of high-quality synthesized molybdenum disulfide (MoS(2)) is a major n-doping source. The surface electron concentration of MoS(2) is nearly four orders of magnitude higher than that of its inner bulk. Substantial thickness-dependent conductivity in MoS(2) nanoflakes was observed. The transfer length method suggested the current transport in MoS(2) following a two-dimensional behavior rather than the conventional three-dimensional mode. Scanning tunneling microscopy and angle-resolved photoemission spectroscopy measurements confirmed the presence of surface electron accumulation in this layered material. Notably, the in situ-cleaved surface exhibited a nearly intrinsic state without electron accumulation. Nature Publishing Group UK 2018-04-12 /pmc/articles/PMC5897365/ /pubmed/29650960 http://dx.doi.org/10.1038/s41467-018-03824-6 Text en © The Author(s) 2018 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Siao, M. D. Shen, W. C. Chen, R. S. Chang, Z. W. Shih, M. C. Chiu, Y. P. Cheng, C.-M. Two-dimensional electronic transport and surface electron accumulation in MoS(2) |
title | Two-dimensional electronic transport and surface electron accumulation in MoS(2) |
title_full | Two-dimensional electronic transport and surface electron accumulation in MoS(2) |
title_fullStr | Two-dimensional electronic transport and surface electron accumulation in MoS(2) |
title_full_unstemmed | Two-dimensional electronic transport and surface electron accumulation in MoS(2) |
title_short | Two-dimensional electronic transport and surface electron accumulation in MoS(2) |
title_sort | two-dimensional electronic transport and surface electron accumulation in mos(2) |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5897365/ https://www.ncbi.nlm.nih.gov/pubmed/29650960 http://dx.doi.org/10.1038/s41467-018-03824-6 |
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