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Two-dimensional electronic transport and surface electron accumulation in MoS(2)

Because the surface-to-volume ratio of quasi-two-dimensional materials is extremely high, understanding their surface characteristics is crucial for practically controlling their intrinsic properties and fabricating p-type and n-type layered semiconductors. Van der Waals crystals are expected to hav...

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Autores principales: Siao, M. D., Shen, W. C., Chen, R. S., Chang, Z. W., Shih, M. C., Chiu, Y. P., Cheng, C.-M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5897365/
https://www.ncbi.nlm.nih.gov/pubmed/29650960
http://dx.doi.org/10.1038/s41467-018-03824-6
_version_ 1783313942981902336
author Siao, M. D.
Shen, W. C.
Chen, R. S.
Chang, Z. W.
Shih, M. C.
Chiu, Y. P.
Cheng, C.-M.
author_facet Siao, M. D.
Shen, W. C.
Chen, R. S.
Chang, Z. W.
Shih, M. C.
Chiu, Y. P.
Cheng, C.-M.
author_sort Siao, M. D.
collection PubMed
description Because the surface-to-volume ratio of quasi-two-dimensional materials is extremely high, understanding their surface characteristics is crucial for practically controlling their intrinsic properties and fabricating p-type and n-type layered semiconductors. Van der Waals crystals are expected to have an inert surface because of the absence of dangling bonds. However, here we show that the surface of high-quality synthesized molybdenum disulfide (MoS(2)) is a major n-doping source. The surface electron concentration of MoS(2) is nearly four orders of magnitude higher than that of its inner bulk. Substantial thickness-dependent conductivity in MoS(2) nanoflakes was observed. The transfer length method suggested the current transport in MoS(2) following a two-dimensional behavior rather than the conventional three-dimensional mode. Scanning tunneling microscopy and angle-resolved photoemission spectroscopy measurements confirmed the presence of surface electron accumulation in this layered material. Notably, the in situ-cleaved surface exhibited a nearly intrinsic state without electron accumulation.
format Online
Article
Text
id pubmed-5897365
institution National Center for Biotechnology Information
language English
publishDate 2018
publisher Nature Publishing Group UK
record_format MEDLINE/PubMed
spelling pubmed-58973652018-04-16 Two-dimensional electronic transport and surface electron accumulation in MoS(2) Siao, M. D. Shen, W. C. Chen, R. S. Chang, Z. W. Shih, M. C. Chiu, Y. P. Cheng, C.-M. Nat Commun Article Because the surface-to-volume ratio of quasi-two-dimensional materials is extremely high, understanding their surface characteristics is crucial for practically controlling their intrinsic properties and fabricating p-type and n-type layered semiconductors. Van der Waals crystals are expected to have an inert surface because of the absence of dangling bonds. However, here we show that the surface of high-quality synthesized molybdenum disulfide (MoS(2)) is a major n-doping source. The surface electron concentration of MoS(2) is nearly four orders of magnitude higher than that of its inner bulk. Substantial thickness-dependent conductivity in MoS(2) nanoflakes was observed. The transfer length method suggested the current transport in MoS(2) following a two-dimensional behavior rather than the conventional three-dimensional mode. Scanning tunneling microscopy and angle-resolved photoemission spectroscopy measurements confirmed the presence of surface electron accumulation in this layered material. Notably, the in situ-cleaved surface exhibited a nearly intrinsic state without electron accumulation. Nature Publishing Group UK 2018-04-12 /pmc/articles/PMC5897365/ /pubmed/29650960 http://dx.doi.org/10.1038/s41467-018-03824-6 Text en © The Author(s) 2018 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Siao, M. D.
Shen, W. C.
Chen, R. S.
Chang, Z. W.
Shih, M. C.
Chiu, Y. P.
Cheng, C.-M.
Two-dimensional electronic transport and surface electron accumulation in MoS(2)
title Two-dimensional electronic transport and surface electron accumulation in MoS(2)
title_full Two-dimensional electronic transport and surface electron accumulation in MoS(2)
title_fullStr Two-dimensional electronic transport and surface electron accumulation in MoS(2)
title_full_unstemmed Two-dimensional electronic transport and surface electron accumulation in MoS(2)
title_short Two-dimensional electronic transport and surface electron accumulation in MoS(2)
title_sort two-dimensional electronic transport and surface electron accumulation in mos(2)
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5897365/
https://www.ncbi.nlm.nih.gov/pubmed/29650960
http://dx.doi.org/10.1038/s41467-018-03824-6
work_keys_str_mv AT siaomd twodimensionalelectronictransportandsurfaceelectronaccumulationinmos2
AT shenwc twodimensionalelectronictransportandsurfaceelectronaccumulationinmos2
AT chenrs twodimensionalelectronictransportandsurfaceelectronaccumulationinmos2
AT changzw twodimensionalelectronictransportandsurfaceelectronaccumulationinmos2
AT shihmc twodimensionalelectronictransportandsurfaceelectronaccumulationinmos2
AT chiuyp twodimensionalelectronictransportandsurfaceelectronaccumulationinmos2
AT chengcm twodimensionalelectronictransportandsurfaceelectronaccumulationinmos2