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Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading

Understanding the critical current performance variation of Nb(3)Sn superconducting wires under mechanical loading is a crucial issue for the design of next generation accelerator and fusion magnets. In these applications, the mechanical properties of the conductors may become a limiting factor due...

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Autores principales: Barth, C., Seeber, B., Rack, A., Calzolaio, C., Zhai, Y., Matera, D., Senatore, C.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5920112/
https://www.ncbi.nlm.nih.gov/pubmed/29700359
http://dx.doi.org/10.1038/s41598-018-24966-z
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author Barth, C.
Seeber, B.
Rack, A.
Calzolaio, C.
Zhai, Y.
Matera, D.
Senatore, C.
author_facet Barth, C.
Seeber, B.
Rack, A.
Calzolaio, C.
Zhai, Y.
Matera, D.
Senatore, C.
author_sort Barth, C.
collection PubMed
description Understanding the critical current performance variation of Nb(3)Sn superconducting wires under mechanical loading is a crucial issue for the design of next generation accelerator and fusion magnets. In these applications, the mechanical properties of the conductors may become a limiting factor due to the strong electro-magnetic forces resulting from the combination of large magnets and intense magnetic fields. In particular, the presence of voids in the superconducting filament structure, which are formed during the fabrication and the reaction heat treatment, determines localized stress concentrations and possibly the formation of cracks. In this work, we demonstrate a quantitative correlation between the void morphology and the electro-mechanical limits measured on different Bronze route Nb(3)Sn wires. Hot Isostatic Pressing (HIP) prior to the reaction heat treatment is utilized to partially eliminate the voids. The wires’ void distributions - with and without HIP treatment - are detected and statistically analyzed using high energy X-ray micro tomography. The stress concentration due to the shape and distribution of the voids as well as their impact on the electro-mechanical properties are determined through finite element method modeling. Finally, the results are quantitatively correlated with the experimentally determined limits of the irreversible critical current degradation upon mechanical loading.
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spelling pubmed-59201122018-05-01 Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading Barth, C. Seeber, B. Rack, A. Calzolaio, C. Zhai, Y. Matera, D. Senatore, C. Sci Rep Article Understanding the critical current performance variation of Nb(3)Sn superconducting wires under mechanical loading is a crucial issue for the design of next generation accelerator and fusion magnets. In these applications, the mechanical properties of the conductors may become a limiting factor due to the strong electro-magnetic forces resulting from the combination of large magnets and intense magnetic fields. In particular, the presence of voids in the superconducting filament structure, which are formed during the fabrication and the reaction heat treatment, determines localized stress concentrations and possibly the formation of cracks. In this work, we demonstrate a quantitative correlation between the void morphology and the electro-mechanical limits measured on different Bronze route Nb(3)Sn wires. Hot Isostatic Pressing (HIP) prior to the reaction heat treatment is utilized to partially eliminate the voids. The wires’ void distributions - with and without HIP treatment - are detected and statistically analyzed using high energy X-ray micro tomography. The stress concentration due to the shape and distribution of the voids as well as their impact on the electro-mechanical properties are determined through finite element method modeling. Finally, the results are quantitatively correlated with the experimentally determined limits of the irreversible critical current degradation upon mechanical loading. Nature Publishing Group UK 2018-04-26 /pmc/articles/PMC5920112/ /pubmed/29700359 http://dx.doi.org/10.1038/s41598-018-24966-z Text en © The Author(s) 2018 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Barth, C.
Seeber, B.
Rack, A.
Calzolaio, C.
Zhai, Y.
Matera, D.
Senatore, C.
Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading
title Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading
title_full Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading
title_fullStr Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading
title_full_unstemmed Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading
title_short Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading
title_sort quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5920112/
https://www.ncbi.nlm.nih.gov/pubmed/29700359
http://dx.doi.org/10.1038/s41598-018-24966-z
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