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Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading
Understanding the critical current performance variation of Nb(3)Sn superconducting wires under mechanical loading is a crucial issue for the design of next generation accelerator and fusion magnets. In these applications, the mechanical properties of the conductors may become a limiting factor due...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5920112/ https://www.ncbi.nlm.nih.gov/pubmed/29700359 http://dx.doi.org/10.1038/s41598-018-24966-z |
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author | Barth, C. Seeber, B. Rack, A. Calzolaio, C. Zhai, Y. Matera, D. Senatore, C. |
author_facet | Barth, C. Seeber, B. Rack, A. Calzolaio, C. Zhai, Y. Matera, D. Senatore, C. |
author_sort | Barth, C. |
collection | PubMed |
description | Understanding the critical current performance variation of Nb(3)Sn superconducting wires under mechanical loading is a crucial issue for the design of next generation accelerator and fusion magnets. In these applications, the mechanical properties of the conductors may become a limiting factor due to the strong electro-magnetic forces resulting from the combination of large magnets and intense magnetic fields. In particular, the presence of voids in the superconducting filament structure, which are formed during the fabrication and the reaction heat treatment, determines localized stress concentrations and possibly the formation of cracks. In this work, we demonstrate a quantitative correlation between the void morphology and the electro-mechanical limits measured on different Bronze route Nb(3)Sn wires. Hot Isostatic Pressing (HIP) prior to the reaction heat treatment is utilized to partially eliminate the voids. The wires’ void distributions - with and without HIP treatment - are detected and statistically analyzed using high energy X-ray micro tomography. The stress concentration due to the shape and distribution of the voids as well as their impact on the electro-mechanical properties are determined through finite element method modeling. Finally, the results are quantitatively correlated with the experimentally determined limits of the irreversible critical current degradation upon mechanical loading. |
format | Online Article Text |
id | pubmed-5920112 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-59201122018-05-01 Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading Barth, C. Seeber, B. Rack, A. Calzolaio, C. Zhai, Y. Matera, D. Senatore, C. Sci Rep Article Understanding the critical current performance variation of Nb(3)Sn superconducting wires under mechanical loading is a crucial issue for the design of next generation accelerator and fusion magnets. In these applications, the mechanical properties of the conductors may become a limiting factor due to the strong electro-magnetic forces resulting from the combination of large magnets and intense magnetic fields. In particular, the presence of voids in the superconducting filament structure, which are formed during the fabrication and the reaction heat treatment, determines localized stress concentrations and possibly the formation of cracks. In this work, we demonstrate a quantitative correlation between the void morphology and the electro-mechanical limits measured on different Bronze route Nb(3)Sn wires. Hot Isostatic Pressing (HIP) prior to the reaction heat treatment is utilized to partially eliminate the voids. The wires’ void distributions - with and without HIP treatment - are detected and statistically analyzed using high energy X-ray micro tomography. The stress concentration due to the shape and distribution of the voids as well as their impact on the electro-mechanical properties are determined through finite element method modeling. Finally, the results are quantitatively correlated with the experimentally determined limits of the irreversible critical current degradation upon mechanical loading. Nature Publishing Group UK 2018-04-26 /pmc/articles/PMC5920112/ /pubmed/29700359 http://dx.doi.org/10.1038/s41598-018-24966-z Text en © The Author(s) 2018 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Barth, C. Seeber, B. Rack, A. Calzolaio, C. Zhai, Y. Matera, D. Senatore, C. Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading |
title | Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading |
title_full | Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading |
title_fullStr | Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading |
title_full_unstemmed | Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading |
title_short | Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading |
title_sort | quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5920112/ https://www.ncbi.nlm.nih.gov/pubmed/29700359 http://dx.doi.org/10.1038/s41598-018-24966-z |
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