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Structural defects in a nanomesh of bulk MoS(2) using an anodic aluminum oxide template for photoluminescence efficiency enhancement

Two-dimensional (2D) materials beyond graphene have attracted considerable interest because of the zero bandgap drawbacks of graphene. Transition metal dichalcogenides (TMDs), such as MoS(2) and WSe(2), are the potential candidates for next 2D materials because atomically thin layers of TMDs exhibit...

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Autores principales: Kim, TaeWan, Kim, DongHwan, Choi, Chan Ho, Joung, DaeHwa, Park, JongHoo, Shin, Jae Cheol, Kang, Sang-Woo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5923261/
https://www.ncbi.nlm.nih.gov/pubmed/29703979
http://dx.doi.org/10.1038/s41598-018-25045-z
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author Kim, TaeWan
Kim, DongHwan
Choi, Chan Ho
Joung, DaeHwa
Park, JongHoo
Shin, Jae Cheol
Kang, Sang-Woo
author_facet Kim, TaeWan
Kim, DongHwan
Choi, Chan Ho
Joung, DaeHwa
Park, JongHoo
Shin, Jae Cheol
Kang, Sang-Woo
author_sort Kim, TaeWan
collection PubMed
description Two-dimensional (2D) materials beyond graphene have attracted considerable interest because of the zero bandgap drawbacks of graphene. Transition metal dichalcogenides (TMDs), such as MoS(2) and WSe(2), are the potential candidates for next 2D materials because atomically thin layers of TMDs exhibit unique and versatile electrical and optical properties. Although bulk TMDs materials have an indirect bandgap, an indirect-to-direct bandgap transition is observed in monolayers of TMDs (MoS(2), WSe(2), and MoSe(2)). Optical properties of TMD films can be improved by the introduction of structural defects. For example, large-area spatial tuning of the optical transition of bulk MoS(2) films is achieved by using an anodic aluminum oxide (AAO) template to induce structural defects such as edge- and terrace-terminated defects in a nanomesh structure. Strong photoluminescence emission peaks with a band gap of 1.81 eV are observed, possibly because of radiative transition at the defect sites. This work shows that the AAO template lithography method has potential for the production of homogenous large-scale nanomesh structures for practical semiconductor processing applications in future MoS(2)-based electronic and optical devices.
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spelling pubmed-59232612018-05-01 Structural defects in a nanomesh of bulk MoS(2) using an anodic aluminum oxide template for photoluminescence efficiency enhancement Kim, TaeWan Kim, DongHwan Choi, Chan Ho Joung, DaeHwa Park, JongHoo Shin, Jae Cheol Kang, Sang-Woo Sci Rep Article Two-dimensional (2D) materials beyond graphene have attracted considerable interest because of the zero bandgap drawbacks of graphene. Transition metal dichalcogenides (TMDs), such as MoS(2) and WSe(2), are the potential candidates for next 2D materials because atomically thin layers of TMDs exhibit unique and versatile electrical and optical properties. Although bulk TMDs materials have an indirect bandgap, an indirect-to-direct bandgap transition is observed in monolayers of TMDs (MoS(2), WSe(2), and MoSe(2)). Optical properties of TMD films can be improved by the introduction of structural defects. For example, large-area spatial tuning of the optical transition of bulk MoS(2) films is achieved by using an anodic aluminum oxide (AAO) template to induce structural defects such as edge- and terrace-terminated defects in a nanomesh structure. Strong photoluminescence emission peaks with a band gap of 1.81 eV are observed, possibly because of radiative transition at the defect sites. This work shows that the AAO template lithography method has potential for the production of homogenous large-scale nanomesh structures for practical semiconductor processing applications in future MoS(2)-based electronic and optical devices. Nature Publishing Group UK 2018-04-27 /pmc/articles/PMC5923261/ /pubmed/29703979 http://dx.doi.org/10.1038/s41598-018-25045-z Text en © The Author(s) 2018 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Kim, TaeWan
Kim, DongHwan
Choi, Chan Ho
Joung, DaeHwa
Park, JongHoo
Shin, Jae Cheol
Kang, Sang-Woo
Structural defects in a nanomesh of bulk MoS(2) using an anodic aluminum oxide template for photoluminescence efficiency enhancement
title Structural defects in a nanomesh of bulk MoS(2) using an anodic aluminum oxide template for photoluminescence efficiency enhancement
title_full Structural defects in a nanomesh of bulk MoS(2) using an anodic aluminum oxide template for photoluminescence efficiency enhancement
title_fullStr Structural defects in a nanomesh of bulk MoS(2) using an anodic aluminum oxide template for photoluminescence efficiency enhancement
title_full_unstemmed Structural defects in a nanomesh of bulk MoS(2) using an anodic aluminum oxide template for photoluminescence efficiency enhancement
title_short Structural defects in a nanomesh of bulk MoS(2) using an anodic aluminum oxide template for photoluminescence efficiency enhancement
title_sort structural defects in a nanomesh of bulk mos(2) using an anodic aluminum oxide template for photoluminescence efficiency enhancement
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5923261/
https://www.ncbi.nlm.nih.gov/pubmed/29703979
http://dx.doi.org/10.1038/s41598-018-25045-z
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