Evolution of Metastable Defects and Its Effect on the Electronic Properties of MoS(2) Films

We report on structural and electronic properties of defects in chemical vapor-deposited monolayer and few-layer MoS(2) films. Scanning tunneling microscopy, Kelvin probe force microscopy, and transmission electron microscopy were used to obtain high resolution images and quantitative measurements o...

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Detalles Bibliográficos
Autores principales: Precner, M., Polaković, T., Qiao, Qiao, Trainer, D. J., Putilov, A. V., Di Giorgio, C., Cone, I., Zhu, Y., Xi, X. X., Iavarone, M., Karapetrov, G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5928116/
https://www.ncbi.nlm.nih.gov/pubmed/29712931
http://dx.doi.org/10.1038/s41598-018-24913-y

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5928116/
https://www.ncbi.nlm.nih.gov/pubmed/29712931
http://dx.doi.org/10.1038/s41598-018-24913-y

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