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Excitonic Emission of Monolayer Semiconductors Near-Field Coupled to High-Q Microresonators

[Image: see text] We present quantum yield measurements of single layer WSe(2) (1L-WSe(2)) integrated with high-Q (Q > 10(6)) optical microdisk cavities, using an efficient (η > 90%) near-field coupling scheme based on a tapered optical fiber. Coupling of the excitonic emission is achieved by...

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Detalles Bibliográficos
Autores principales: Javerzac-Galy, Clément, Kumar, Anshuman, Schilling, Ryan D., Piro, Nicolas, Khorasani, Sina, Barbone, Matteo, Goykhman, Ilya, Khurgin, Jacob B., Ferrari, Andrea C., Kippenberg, Tobias J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2018
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5946169/
https://www.ncbi.nlm.nih.gov/pubmed/29624396
http://dx.doi.org/10.1021/acs.nanolett.8b00749
Descripción
Sumario:[Image: see text] We present quantum yield measurements of single layer WSe(2) (1L-WSe(2)) integrated with high-Q (Q > 10(6)) optical microdisk cavities, using an efficient (η > 90%) near-field coupling scheme based on a tapered optical fiber. Coupling of the excitonic emission is achieved by placing 1L-WSe(2) in the evanescent cavity field. This preserves the microresonator high intrinsic quality factor (Q > 10(6)) below the bandgap of 1L-WSe(2). The cavity quantum yield is QY(c) ≈ 10(–3), consistent with operation in the broad emitter regime (i.e., the emission lifetime of 1L-WSe(2) is significantly shorter than the bare cavity decay time). This scheme can serve as a precise measurement tool for the excitonic emission of layered materials into cavity modes, for both in plane and out of plane excitation.