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Visual Servoing-Based Nanorobotic System for Automated Electrical Characterization of Nanotubes inside SEM
The maneuvering and electrical characterization of nanotubes inside a scanning electron microscope (SEM) has historically been time-consuming and laborious for operators. Before the development of automated nanomanipulation-enabled techniques for the performance of pick-and-place and characterizatio...
Autores principales: | , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5948737/ https://www.ncbi.nlm.nih.gov/pubmed/29642495 http://dx.doi.org/10.3390/s18041137 |
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author | Ding, Huiyang Shi, Chaoyang Ma, Li Yang, Zhan Wang, Mingyu Wang, Yaqiong Chen, Tao Sun, Lining Toshio, Fukuda |
author_facet | Ding, Huiyang Shi, Chaoyang Ma, Li Yang, Zhan Wang, Mingyu Wang, Yaqiong Chen, Tao Sun, Lining Toshio, Fukuda |
author_sort | Ding, Huiyang |
collection | PubMed |
description | The maneuvering and electrical characterization of nanotubes inside a scanning electron microscope (SEM) has historically been time-consuming and laborious for operators. Before the development of automated nanomanipulation-enabled techniques for the performance of pick-and-place and characterization of nanoobjects, these functions were still incomplete and largely operated manually. In this paper, a dual-probe nanomanipulation system vision-based feedback was demonstrated to automatically perform 3D nanomanipulation tasks, to investigate the electrical characterization of nanotubes. The XY-position of Atomic Force Microscope (AFM) cantilevers and individual carbon nanotubes (CNTs) were precisely recognized via a series of image processing operations. A coarse-to-fine positioning strategy in the Z-direction was applied through the combination of the sharpness-based depth estimation method and the contact-detection method. The use of nanorobotic magnification-regulated speed aided in improving working efficiency and reliability. Additionally, we proposed automated alignment of manipulator axes by visual tracking the movement trajectory of the end effector. The experimental results indicate the system’s capability for automated measurement electrical characterization of CNTs. Furthermore, the automated nanomanipulation system has the potential to be extended to other nanomanipulation tasks. |
format | Online Article Text |
id | pubmed-5948737 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-59487372018-05-17 Visual Servoing-Based Nanorobotic System for Automated Electrical Characterization of Nanotubes inside SEM Ding, Huiyang Shi, Chaoyang Ma, Li Yang, Zhan Wang, Mingyu Wang, Yaqiong Chen, Tao Sun, Lining Toshio, Fukuda Sensors (Basel) Article The maneuvering and electrical characterization of nanotubes inside a scanning electron microscope (SEM) has historically been time-consuming and laborious for operators. Before the development of automated nanomanipulation-enabled techniques for the performance of pick-and-place and characterization of nanoobjects, these functions were still incomplete and largely operated manually. In this paper, a dual-probe nanomanipulation system vision-based feedback was demonstrated to automatically perform 3D nanomanipulation tasks, to investigate the electrical characterization of nanotubes. The XY-position of Atomic Force Microscope (AFM) cantilevers and individual carbon nanotubes (CNTs) were precisely recognized via a series of image processing operations. A coarse-to-fine positioning strategy in the Z-direction was applied through the combination of the sharpness-based depth estimation method and the contact-detection method. The use of nanorobotic magnification-regulated speed aided in improving working efficiency and reliability. Additionally, we proposed automated alignment of manipulator axes by visual tracking the movement trajectory of the end effector. The experimental results indicate the system’s capability for automated measurement electrical characterization of CNTs. Furthermore, the automated nanomanipulation system has the potential to be extended to other nanomanipulation tasks. MDPI 2018-04-08 /pmc/articles/PMC5948737/ /pubmed/29642495 http://dx.doi.org/10.3390/s18041137 Text en © 2018 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Ding, Huiyang Shi, Chaoyang Ma, Li Yang, Zhan Wang, Mingyu Wang, Yaqiong Chen, Tao Sun, Lining Toshio, Fukuda Visual Servoing-Based Nanorobotic System for Automated Electrical Characterization of Nanotubes inside SEM |
title | Visual Servoing-Based Nanorobotic System for Automated Electrical Characterization of Nanotubes inside SEM |
title_full | Visual Servoing-Based Nanorobotic System for Automated Electrical Characterization of Nanotubes inside SEM |
title_fullStr | Visual Servoing-Based Nanorobotic System for Automated Electrical Characterization of Nanotubes inside SEM |
title_full_unstemmed | Visual Servoing-Based Nanorobotic System for Automated Electrical Characterization of Nanotubes inside SEM |
title_short | Visual Servoing-Based Nanorobotic System for Automated Electrical Characterization of Nanotubes inside SEM |
title_sort | visual servoing-based nanorobotic system for automated electrical characterization of nanotubes inside sem |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5948737/ https://www.ncbi.nlm.nih.gov/pubmed/29642495 http://dx.doi.org/10.3390/s18041137 |
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