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Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials
Many functional materials are difficult to analyse by scanning transmission electron microscopy (STEM) on account of their beam sensitivity and low contrast between different phases. The problem becomes even more severe when thick specimens need to be investigated, a situation that is common for mat...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
The Royal Society Publishing
2018
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5990820/ https://www.ncbi.nlm.nih.gov/pubmed/29892376 http://dx.doi.org/10.1098/rsos.171838 |