Cargando…
Effect of Different Gate Lengths on Polarization Coulomb Field Scattering Potential in AlGaN/GaN Heterostructure Field-Effect Transistors
The AlGaN/GaN heterostructure field-effect transistors with different gate lengths were fabricated. Based on the chosen of the Hamiltonian of the system and the additional polarization charges, two methods to calculate PCF scattering by the scattering theory were presented. By comparing the measured...
Autores principales: | Cui, Peng, Mo, Jianghui, Fu, Chen, Lv, Yuanjie, Liu, Huan, Cheng, Aijie, Luan, Chongbiao, Zhou, Yang, Dai, Gang, Lin, Zhaojun |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2018
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5998000/ https://www.ncbi.nlm.nih.gov/pubmed/29899499 http://dx.doi.org/10.1038/s41598-018-27357-6 |
Ejemplares similares
-
Improved Linearity with Polarization Coulomb Field Scattering in AlGaN/GaN Heterostructure Field-Effect Transistors
por: Cui, Peng, et al.
Publicado: (2018) -
Effect of Polarization Coulomb Field Scattering on Electrical Properties of the 70-nm Gate-Length AlGaN/GaN HEMTs
por: Cui, Peng, et al.
Publicado: (2018) -
A novel AlGaN/GaN heterostructure field-effect transistor based on open-gate technology
por: Liu, Yang, et al.
Publicado: (2021) -
Influence of the ratio of gate length to drain-to-source distance on the electron mobility in AlGaN/AlN/GaN heterostructure field-effect transistors
por: Lv, Yuanjie, et al.
Publicado: (2012) -
Synthesis of titanium nitride for self-aligned gate AlGaN/GaN heterostructure field-effect transistors
por: Li, Liuan, et al.
Publicado: (2014)