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Genome-wide association mapping for resistance to leaf rust, stripe rust and tan spot in wheat reveals potential candidate genes
KEY MESSAGE: Genome-wide association mapping in conjunction with population sequencing map and Ensembl plants was used to identify markers/candidate genes linked to leaf rust, stripe rust and tan spot resistance in wheat. ABSTRACT: Leaf rust (LR), stripe rust (YR) and tan spot (TS) are some of the i...
Autores principales: | Juliana, Philomin, Singh, Ravi P., Singh, Pawan K., Poland, Jesse A., Bergstrom, Gary C., Huerta-Espino, Julio, Bhavani, Sridhar, Crossa, Jose, Sorrells, Mark E. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer Berlin Heidelberg
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6004277/ https://www.ncbi.nlm.nih.gov/pubmed/29589041 http://dx.doi.org/10.1007/s00122-018-3086-6 |
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