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Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics
The nanoscale optoelectronic properties of materials can be especially important for polycrystalline photovoltaics including many sensor and solar cell designs. For thin film solar cells such as CdTe, the open-circuit voltage and short-circuit current are especially critical performance indicators,...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Beilstein-Institut
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6009312/ https://www.ncbi.nlm.nih.gov/pubmed/29977713 http://dx.doi.org/10.3762/bjnano.9.171 |
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author | Atamanuk, Katherine Luria, Justin Huey, Bryan D |
author_facet | Atamanuk, Katherine Luria, Justin Huey, Bryan D |
author_sort | Atamanuk, Katherine |
collection | PubMed |
description | The nanoscale optoelectronic properties of materials can be especially important for polycrystalline photovoltaics including many sensor and solar cell designs. For thin film solar cells such as CdTe, the open-circuit voltage and short-circuit current are especially critical performance indicators, often varying between and even within individual grains. A new method for directly mapping the open-circuit voltage leverages photo-conducting AFM, along with an additional proportional-integral-derivative feedback loop configured to maintain open-circuit conditions while scanning. Alternating with short-circuit current mapping efficiently provides complementary insight into the highly microstructurally sensitive local and ensemble photovoltaic performance. Furthermore, direct open-circuit voltage mapping is compatible with tomographic AFM, which additionally leverages gradual nanoscale milling by the AFM probe essentially for serial sectioning. The two-dimensional and three-dimensional results for CdTe solar cells during in situ illumination reveal local to mesoscale contributions to PV performance based on the order of magnitude variations in photovoltaic properties with distinct grains, at grain boundaries, and for sub-granular planar defects. |
format | Online Article Text |
id | pubmed-6009312 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
publisher | Beilstein-Institut |
record_format | MEDLINE/PubMed |
spelling | pubmed-60093122018-07-05 Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics Atamanuk, Katherine Luria, Justin Huey, Bryan D Beilstein J Nanotechnol Full Research Paper The nanoscale optoelectronic properties of materials can be especially important for polycrystalline photovoltaics including many sensor and solar cell designs. For thin film solar cells such as CdTe, the open-circuit voltage and short-circuit current are especially critical performance indicators, often varying between and even within individual grains. A new method for directly mapping the open-circuit voltage leverages photo-conducting AFM, along with an additional proportional-integral-derivative feedback loop configured to maintain open-circuit conditions while scanning. Alternating with short-circuit current mapping efficiently provides complementary insight into the highly microstructurally sensitive local and ensemble photovoltaic performance. Furthermore, direct open-circuit voltage mapping is compatible with tomographic AFM, which additionally leverages gradual nanoscale milling by the AFM probe essentially for serial sectioning. The two-dimensional and three-dimensional results for CdTe solar cells during in situ illumination reveal local to mesoscale contributions to PV performance based on the order of magnitude variations in photovoltaic properties with distinct grains, at grain boundaries, and for sub-granular planar defects. Beilstein-Institut 2018-06-14 /pmc/articles/PMC6009312/ /pubmed/29977713 http://dx.doi.org/10.3762/bjnano.9.171 Text en Copyright © 2018, Atamanuk et al. https://creativecommons.org/licenses/by/4.0https://www.beilstein-journals.org/bjnano/termsThis is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms) |
spellingShingle | Full Research Paper Atamanuk, Katherine Luria, Justin Huey, Bryan D Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics |
title | Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics |
title_full | Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics |
title_fullStr | Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics |
title_full_unstemmed | Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics |
title_short | Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics |
title_sort | direct afm-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics |
topic | Full Research Paper |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6009312/ https://www.ncbi.nlm.nih.gov/pubmed/29977713 http://dx.doi.org/10.3762/bjnano.9.171 |
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