A Temperature Drift Compensation Method for Pulsed Eddy Current Technology

Pulsed eddy current (PEC) technology is another important non-contact nondestructive testing technology for defect detection. However, the temperature drift of the exciting coil has a considerable influence on the precision of PEC testing. The objective of this study is to investigate the temperatur...

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Autores principales: Lei, Biting, Yi, Pengxing, Li, Yahui, Xiang, Jiayun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6022163/
https://www.ncbi.nlm.nih.gov/pubmed/29914138
http://dx.doi.org/10.3390/s18061952
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author Lei, Biting
Yi, Pengxing
Li, Yahui
Xiang, Jiayun
author_facet Lei, Biting
Yi, Pengxing
Li, Yahui
Xiang, Jiayun
author_sort Lei, Biting
collection PubMed
description Pulsed eddy current (PEC) technology is another important non-contact nondestructive testing technology for defect detection. However, the temperature drift of the exciting coil has a considerable influence on the precision of PEC testing. The objective of this study is to investigate the temperature drift effect and reduce its impact. The temperature drift effect is analyzed theoretically and experimentally. The temperature drift effect on the peak-to-peak values of the output signal is investigated, and a temperature compensation method is proposed to reduce the effect of temperature variation. The results show that temperature drift has a negative impact on PEC testing and the temperature compensation method can effectively reduce the effect of temperature drift.
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spelling pubmed-60221632018-07-02 A Temperature Drift Compensation Method for Pulsed Eddy Current Technology Lei, Biting Yi, Pengxing Li, Yahui Xiang, Jiayun Sensors (Basel) Article Pulsed eddy current (PEC) technology is another important non-contact nondestructive testing technology for defect detection. However, the temperature drift of the exciting coil has a considerable influence on the precision of PEC testing. The objective of this study is to investigate the temperature drift effect and reduce its impact. The temperature drift effect is analyzed theoretically and experimentally. The temperature drift effect on the peak-to-peak values of the output signal is investigated, and a temperature compensation method is proposed to reduce the effect of temperature variation. The results show that temperature drift has a negative impact on PEC testing and the temperature compensation method can effectively reduce the effect of temperature drift. MDPI 2018-06-15 /pmc/articles/PMC6022163/ /pubmed/29914138 http://dx.doi.org/10.3390/s18061952 Text en © 2018 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Lei, Biting
Yi, Pengxing
Li, Yahui
Xiang, Jiayun
A Temperature Drift Compensation Method for Pulsed Eddy Current Technology
title A Temperature Drift Compensation Method for Pulsed Eddy Current Technology
title_full A Temperature Drift Compensation Method for Pulsed Eddy Current Technology
title_fullStr A Temperature Drift Compensation Method for Pulsed Eddy Current Technology
title_full_unstemmed A Temperature Drift Compensation Method for Pulsed Eddy Current Technology
title_short A Temperature Drift Compensation Method for Pulsed Eddy Current Technology
title_sort temperature drift compensation method for pulsed eddy current technology
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6022163/
https://www.ncbi.nlm.nih.gov/pubmed/29914138
http://dx.doi.org/10.3390/s18061952
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